MPC5554MVR132R2 - Freescale Semiconductor

Freescale Semiconductor

Data Sheet: Technical Data

Contents

Document Number: MPC5554

Rev. 4, May 2012

This document provides electrical specifications, pin

assignments, and package diagrams for the MPC5554

microcontroller device. For functional characteristics,

refer to the MPC5553/MPC5554 Microcontroller

Reference Manual.

1 Overview

The MPC5554 microcontroller (MCU) is a member of

the MPC5500 family of microcontrollers built on the

Power Architectureembedded technology. This family

of parts has many new features coupled with high

performance CMOS technology to provide substantial

reduction of cost per feature and significant performance

improvement over the MPC500 family.

The host processor core of this device complies with the

Power Architecture embedded category that is 100%

user-mode compatible (including floating point library)

with the original PowerPC instruction set. The embedded

architecture enhancements improve the performance in

embedded applications. The core also has additional

instructions, including digital signal processing (DSP)

instructions, beyond the original PowerPC instruction

set.

1 Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

2 Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

3 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . 4

3.1 Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . 4

3.2 Thermal Characteristics. . . . . . . . . . . . . . . . . . . . . . 5

3.3 Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

3.4 EMI (Electromagnetic Interference) Characteristics 8

3.5 ESD (Electromagnetic Static Discharge) Characteris-

tics9

3.6 Voltage Regulator Controller (VRC) and

Power-On Reset (POR) Electrical Specifications9

3.7 Power-Up/Down Sequencing . . . . . . . . . . . . . . . . 10

3.8 DC Electrical Specifications. . . . . . . . . . . . . . . . . . 14

3.9 Oscillator and FMPLL Electrical Characteristics . . 20

3.10 eQADC Electrical Characteristics . . . . . . . . . . . . . 22

3.11 H7Fa Flash Memory Electrical Characteristics . . . 23

3.12 AC Specifications . . . . . . . . . . . . . . . . . . . . . . . . . 24

3.13 AC Timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

4 Mechanicals. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45

4.1 MPC5553546667 416 PBGA Pinout . . . . . . . . . . . 45

4.2 MPC5554 416-Pin Package Dimensions . . . . . . . 52

5 Revision History for the MPC5554 Data Sheet . . . . . . 54

5.1 Changes between Revision 3 and Revision 4 . . . . 54

5.2 Changes between Revision 2 and Revision 3 . . . . 54

MPC5554

Microcontroller Data Sheet

by: Microcontroller Division

MPC5554 Microcontroller Data Sheet, Rev. 4

Overview

Freescale Semiconductor2

The MPC5500 family of parts contains many new features coupled with high performance CMOS

technology to provide significant performance improvement over the MPC565.

The MPC5554 has two levels of memory hierarchy. The fastest accesses are to the 32-kilobytes (KB)

unified cache. The next level in the hierarchy contains the 64-KB on-chip internal SRAM and

two-megabytes (MB) internal flash memory. The internal SRAM and flash memory hold instructions and

data. The external bus interface is designed to support most of the standard memories used with the

MPC5xx family.

The complex input/output timer functions of the MPC5554 are performed by two enhanced time processor

unit (eTPU) engines. Each eTPU engine controls 32 hardware channels, providing a total of 64 hardware

channels. The eTPU has been enhanced over the TPU by providing: 24-bit timers, double-action hardware

channels, variable number of parameters per channel, angle clock hardware, and additional control and

arithmetic instructions. The eTPU is programmed using a high-level programming language.

The less complex timer functions of the MPC5554 are performed by the enhanced modular input/output

system (eMIOS). The eMIOS’ 24 hardware channels are capable of single-action, double-action,

pulse-width modulation (PWM), and modulus-counter operations. Motor control capabilities include

edge-aligned and center-aligned PWM.

Off-chip communication is performed by a suite of serial protocols including controller area networks

(FlexCANs), enhanced deserial/serial peripheral interfaces (DSPIs), and enhanced serial communications

interfaces (eSCIs). The DSPIs support pin reduction through hardware serialization and deserialization of

timer channels and general-purpose input/output (GPIOs) signals.

The MCU has an on-chip enhanced queued dual analog-to-digital converter (eQADC). 324 s40-channels.

The system integration unit (SIU) performs several chip-wide configuration functions. Pad configuration

and general-purpose input and output (GPIO) are controlled from the SIU. External interrupts and reset

control are also determined by the SIU. The internal multiplexer submodule provides multiplexing of

eQADC trigger sources, daisy chaining the DSPIs, and external interrupt signal multiplexing.

Ordering Information

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 3

2 Ordering Information

Figure 1. MPC5500 Family Part Number Example

Unless noted in this data sheet, all specifications apply from TL to TH.

Table 1. Orderable Part Numbers

Freescale Part Number1

1All devices are PPC5554, rather than MPC5554, until product qualifications are complete. Not all configurations are available in

the PPC parts.

Package Description

Speed (MHz) Operating Temperature 2

2The lowest ambient operating temperature is referenced by TL; the highest ambient operating temperature is referenced by TH.

Nominal Max. 3 (fMAX)

3Speed is the nominal maximum frequency. Max. speed is the maximum speed allowed including frequency modulation (FM).

82 MHz parts allow for 80 MHz system clock + 2% FM; 114 MHz parts allow for 112 MHz system clock + 2% FM; and132 MHz

parts allow for 128 MHz system clock + 2% FM.

Min. (TL)Max. (T

MPC5554MVR132

MPC5554 416 package

Lead-free (PbFree)

132 132

–40° C 125° CMPC5554MVR112 112 114

MPC5554MVR80 80 82

MPC5554AVR132 132 132 –55° C 125° C

MPC5554MZP132

MPC5554 416 package

Leaded (SnPb)

132 132

–40° C 125° CMPC5554MZP112 112 114

MPC5554MZP80 80 82

MPC5554AZP132 132 132 –55° C 125° C

MPC M 80

Qualification status

Core code

Device number

Temperature range

Package identifier

Operating frequency (MHz)

Tape and reel status

Temperature Range

M = –40° C to 125° C

A = –55° C to 125° C

Package Identifier

ZP = 416PBGA SnPb

VR = 416PBGA Pb-free

Operating Frequency

80 = 80 MHz

112 = 112 MHz

132 = 132 MHz

Tape and Reel Status

R2 = Tape and reel

(blank) = Trays

Qualification Status

P = Pre qualification

M = Fully spec. qualified

5554 ZP

Note: Not all options are available on all devices. Refer to Ta bl e 1.

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor4

3 Electrical Characteristics

This section contains detailed information on power considerations, DC/AC electrical characteristics, and

AC timing specifications for the MCU.

3.1 Maximum Ratings

Table 2. Absolute Maximum Ratings 1

Spec Characteristic Symbol Min. Max. Unit

1 1.5 V core supply voltage 2VDD –0.3 1.7 V

2 Flash program/erase voltage VPP –0.3 6.5 V

4 Flash read voltage VFLASH –0.3 4.6 V

5 SRAM standby voltage VSTBY –0.3 1.7 V

6 Clock synthesizer voltage VDDSYN –0.3 4.6 V

7 3.3 V I/O buffer voltage VDD33 –0.3 4.6 V

8 Voltage regulator control input voltage VRC33 –0.3 4.6 V

9 Analog supply voltage (reference to VSSA)V

DDA –0.3 5.5 V

10 I/O supply voltage (fast I/O pads) 3VDDE –0.3 4.6 V

11 I/O supply voltage (slow and medium I/O pads) 3VDDEH –0.3 6.5 V

12 DC input voltage 4

VDDEH powered I/O pads

VDDE powered I/O pads

VIN

–1.0 5

6.5 6

4.6 7

13 Analog reference high voltage (reference to VRL)V

RH –0.3 5.5 V

14 VSS to VSSA differential voltage VSS – VSSA –0.1 0.1 V

15 VDD to VDDA differential voltage VDD – VDDA –VDDA VDD V

16 VREF differential voltage VRH – VRL –0.3 5.5 V

17 VRH to VDDA differential voltage VRH – VDDA –5.5 5.5 V

18 VRL to VSSA differential voltage VRL – VSSA –0.3 0.3 V

19 VDDEH to VDDA differential voltage VDDEH – VDDA –VDDA VDDEH V

20 VDDF to VDD differential voltage VDDF – VDD –0.3 0.3 V

21 VRC33 to VDDSYN differential voltage spec has been moved to Ta b le 9 DC Electrical Specifications, Spec 43a.

22 VSSSYN to VSS differential voltage VSSSYN – VSS –0.1 0.1 V

23 VRCVSS to VSS differential voltage VRCVSS – VSS –0.1 0.1 V

24 Maximum DC digital input current 8

(per pin, applies to all digital pins) 4 IMAXD –2 2 mA

25 Maximum DC analog input current 9

(per pin, applies to all analog pins)

IMAXA –3 3 mA

26 Maximum operating temperature range 10

Die junction temperature

TJTL150.0 oC

27 Storage temperature range TSTG –55.0 150.0 oC

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 5

3.2 Thermal Characteristics

The shaded rows in the following table indicate information specific to a four-layer board.

28 Maximum solder temperature 11

Lead free (Pb-free)

Leaded (SnPb)

TSDR —

—

260.0

245.0

29 Moisture sensitivity level 12 MSL — 3

1Functional operating conditions are given in the DC electrical specifications. Absolute maximum ratings are stress ratings only,

and functional operation at the maxima is not guaranteed. Stress beyond any of the listed maxima can affect device reliability

or cause permanent damage to the device.

21.5 V ± 10% for proper operation. This parameter is specified at a maximum junction temperature of 150 oC.

3All functional non-supply I/O pins are clamped to VSS and VDDE, or VDDEH.

4AC signal overshoot and undershoot of up to ± 2.0 V of the input voltages is permitted for an accumulative duration of

60 hours over the complete lifetime of the device (injection current not limited for this duration).

5Internal structures hold the voltage greater than –1.0 V if the injection current limit of 2 mA is met. Keep the negative DC

voltage greater than –0.6 V on eTPUB[15] and SINB during the internal power-on reset (POR) state.

6Internal structures hold the input voltage less than the maximum voltage on all pads powered by VDDEH supplies, if the

maximum injection current specification is met (2 mA for all pins) and VDDEH is within the operating voltage specifications.

7Internal structures hold the input voltage less than the maximum voltage on all pads powered by VDDE supplies, if the maximum

injection current specification is met (2 mA for all pins) and VDDE is within the operating voltage specifications.

8Total injection current for all pins (including both digital and analog) must not exceed 25 mA.

9Total injection current for all analog input pins must not exceed 15 mA.

10 Lifetime operation at these specification limits is not guaranteed.

11 Moisture sensitivity profile per IPC/JEDEC J-STD-020D.

12 Moisture sensitivity per JEDEC test method A112.

Table 3. MPC5554 Thermal Characteristics

Spec MPC5554 Thermal Characteristic Symbol 416 PBGA Unit

1 Junction to ambient 1, 2, natural convection (one-layer board)

1Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board)

temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal

resistance.

2Per SEMI G38-87 and JEDEC JESD51-2 with the single-layer board horizontal.

RJA 24 °C/W

2Junction to ambient 1, 3, natural convection (four-layer board 2s2p)

3Per JEDEC JESD51-6 with the board horizontal.

RJA 18 °C/W

3 Junction to ambient 1, 3 (@200 ft./min., one-layer board) RJMA 19 °C/W

4Junction to ambient 1, 3 (@200 ft./min., four-layer board 2s2p) RJMA 15 °C/W

5Junction to board 4 (four-layer board 2s2p)

4Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on

the top surface of the board near the package.

RJB 9°C/W

6 Junction to case 5

5Indicates the average thermal resistance between the die and the case top surface as measured by the cold plate method

(MIL SPEC-883 Method 1012.1) with the cold plate temperature used for the case temperature.

RJC 5°C/W

7 Junction to package top 6, natural convection

6Thermal characterization parameter indicating the temperature difference between package top and the junction temperature

per JEDEC JESD51-2.

JT 2°C/W

Table 2. Absolute Maximum Ratings 1 (continued)

Spec Characteristic Symbol Min. Max. Unit

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor6

3.2.1 General Notes for Specifications at Maximum Junction Temperature

An estimation of the device junction temperature, TJ, can be obtained from the equation:

TJ = TA + (RJA  PD)

where:

TA = ambient temperature for the package (oC)

RJA = junction to ambient thermal resistance (oC/W)

PD = power dissipation in the package (W)

The thermal resistance values used are based on the JEDEC JESD51 series of standards to provide

consistent values for estimations and comparisons. The difference between the values determined for the

single-layer (1s) board compared to a four-layer board that has two signal layers, a power and a ground

plane (2s2p), demonstrate that the effective thermal resistance is not a constant. The thermal resistance

depends on the:

• Construction of the application board (number of planes)

• Effective size of the board which cools the component

• Quality of the thermal and electrical connections to the planes

• Power dissipated by adjacent components

Connect all the ground and power balls to the respective planes with one via per ball. Using fewer vias to

connect the package to the planes reduces the thermal performance. Thinner planes also reduce the thermal

performance. When the clearance between the vias leave the planes virtually disconnected, the thermal

performance is also greatly reduced.

As a general rule, the value obtained on a single-layer board is within the normal range for the tightly

packed printed circuit board. The value obtained on a board with the internal planes is usually within the

normal range if the application board has:

• One oz. (35 micron nominal thickness) internal planes

• Components are well separated

• Overall power dissipation on the board is less than 0.02 W/cm2

The thermal performance of any component depends on the power dissipation of the surrounding

components. In addition, the ambient temperature varies widely within the application. For many natural

convection and especially closed box applications, the board temperature at the perimeter (edge) of the

package is approximately the same as the local air temperature near the device. Specifying the local

ambient conditions explicitly as the board temperature provides a more precise description of the local

ambient conditions that determine the temperature of the device.

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 7

At a known board temperature, the junction temperature is estimated using the following equation:

TJ = TB + (RJB  PD)

where:

TJ = junction temperature (oC)

TB = board temperature at the package perimeter (oC/W)

RJB = junction-to-board thermal resistance (oC/W) per JESD51-8

PD = power dissipation in the package (W)

When the heat loss from the package case to the air does not factor into the calculation, an acceptable value

for the junction temperature is predictable. Ensure the application board is similar to the thermal test

condition, with the component soldered to a board with internal planes.

The thermal resistance is expressed as the sum of a junction-to-case thermal resistance plus a

case-to-ambient thermal resistance:

RJA = RJC + RCA

where:

RJA = junction-to-ambient thermal resistance (oC/W)

RJC = junction-to-case thermal resistance (oC/W)

RCA = case-to-ambient thermal resistance (oC/W)

RJC is device related and is not affected by other factors. The thermal environment can be controlled to

change the case-to-ambient thermal resistance, RCA. For example, change the air flow around the device,

add a heat sink, change the mounting arrangement on the printed circuit board, or change the thermal

dissipation on the printed circuit board surrounding the device. This description is most useful for

packages with heat sinks where 90% of the heat flow is through the case to heat sink to ambient.

For most packages, a better model is required.

A more accurate two-resistor thermal model can be constructed from the junction-to-board thermal

resistance and the junction-to-case thermal resistance. The junction-to-case thermal resistance describes

when using a heat sink or where a substantial amount of heat is dissipated from the top of the package. The

junction-to-board thermal resistance describes the thermal performance when most of the heat is

conducted to the printed circuit board. This model can be used to generate simple estimations and for

computational fluid dynamics (CFD) thermal models.

To determine the junction temperature of the device in the application on a prototype board, use the

thermal characterization parameter (JT) to determine the junction temperature by measuring the

temperature at the top center of the package case using the following equation:

TJ = TT + (JT  PD)

where:

TT = thermocouple temperature on top of the package (oC)

JT = thermal characterization parameter (oC/W)

PD = power dissipation in the package (W)

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor8

The thermal characterization parameter is measured in compliance with the JESD51-2 specification using

a 40-gauge type T thermocouple epoxied to the top center of the package case. Position the thermocouple

so that the thermocouple junction rests on the package. Place a small amount of epoxy on the thermocouple

junction and approximately 1 mm of wire extending from the junction. Place the thermocouple wire flat

against the package case to avoid measurement errors caused by the cooling effects of the thermocouple

wire.

References:

Semiconductor Equipment and Materials International

3081 Zanker Rd.

San Jose, CA., 95134

(408) 943-6900

MIL-SPEC and EIA/JESD (JEDEC) specifications are available from Global Engineering Documents at

800-854-7179 or 303-397-7956.

JEDEC specifications are available on the web at http://www.jedec.org.

1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive

Engine Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47–54.

2. G. Kromann, S. Shidore, and S. Addison, “Thermal Modeling of a PBGA for Air-Cooled Applica-

tions,” Electronic Packaging and Production, pp. 53–58, March 1998.

3. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and

Its Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212–220.

3.3 Package

The MPC5554 is available in packaged form. Read the package options in Section 2, “Ordering

Information.” Refer to Section 4, “Mechanicals,” for pinouts and package drawings.

3.4 EMI (Electromagnetic Interference) Characteristics

Table 4. EMI Testing Specifications 1

1EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03. Qualification testing was performed on the MPC5554

and applied to the MPC5500 family as generic EMI performance data.

Spec Characteristic Minimum Typical Maximum Unit

1 Scan range 0.15 — 1000 MHz

2 Operating frequency — — fMAX MHz

DD operating voltages — 1.5 — V

DDSYN, VRC33, VDD33, VFLASH, VDDE operating voltages — 3.3 — V

, VDDEH, VDDA operating voltages — 5.0 — V

6 Maximum amplitude — — 14 2

32 3

2Measured with the single-chip EMI program.

3Measured with the expanded EMI program.

dBuV

7 Operating temperature — — 25 oC

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 9

3.5 ESD (Electromagnetic Static Discharge) Characteristics

3.6 Voltage Regulator Controller (VRC) and

Power-On Reset (POR) Electrical Specifications

The following table lists the VRC and POR electrical specifications:

Table 5. ESD Ratings 1, 2

1All ESD testing conforms to CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits.

2Device failure is defined as: ‘If after exposure to ESD pulses, the device does not meet the device specification requirements,

which includes the complete DC parametric and functional testing at room temperature and hot temperature.

Characteristic Symbol Value Unit

ESD for human body model (HBM) 2000 V

HBM circuit description R1 1500 

C100 pF

ESD for field induced charge model (FDCM) 500 (all pins)

750 (corner pins)

Number of pulses per pin:

Positive pulses (HBM)

Negative pulses (HBM)

—

Interval of pulses — 1 second

Table 6. VRC and POR Electrical Specifications

Spec Characteristic Symbol Min. Max. Units

11.5 V (V

DD) POR 1Negated (ramp up)

Asserted (ramp down) VPOR15

1.1

1.35

1.35 V

23.3 V (V

DDSYN) POR 1

Asserted (ramp up)

Negated (ramp up)

Asserted (ramp down)

Negated (ramp down)

VPOR33

0.0

2.0

0.0

0.30

2.85

0.30

3RESET pin supply

(VDDEH6) POR 1, 2

Negated (ramp up)

Asserted (ramp down) VPOR5

2.0

2.85

2.85 V

VRC33 voltage

Before VRC allows the pass

transistor to start turning on VTRANS_START 1.0 2.0 V

5When VRC allows the pass

transistor to completely turn on 3, 4VTRANS_ON 2.0 2.85 V

When the voltage is greater than

the voltage at which the VRC keeps

the 1.5 V supply in regulation 5, 6

VVRC33REG 3.0 — V

– 55o C711.0 — mA

Current can be sourced –40o C11.0—mA

7 by VRCCTL at Tj: 25o CI

VRCCTL 89.0 — mA

150o C 7.5 — mA

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor10

3.7 Power-Up/Down Sequencing

Power sequencing between the 1.5 V power supply and VDDSYN or the RESET power supplies is required

if using an external 1.5 V power supply with VRC33 tied to ground (GND). To avoid power-sequencing,

VRC33 must be powered up within the specified operating range, even if the on-chip voltage regulator

controller is not used. Refer to Section 3.7.2, “Power-Up Sequence (VRC33 Grounded),” and

Section 3.7.3, “Power-Down Sequence (VRC33 Grounded).”

Power sequencing requires that VDD33 must reach a certain voltage where the values are read as ones

before the POR signal negates. Refer to Section 3.7.1, “Input Value of Pins During POR Dependent on

VDD33.”

Although power sequencing is not required between VRC33 and VDDSYN during power up, VRC33 must

not lead VDDSYN by more than 600 mV or lag by more than 100 mV for the VRC stage turn-on to operate

within specification. Higher spikes in the emitter current of the pass transistor occur if VRC33 leads or lags

VDDSYN by more than these amounts. The value of that higher spike in current depends on the board power

supply circuitry and the amount of board level capacitance.

Voltage differential during power up such that:

VDD33 can lag VDDSYN or VDDEH6 before VDDSYN and VDDEH6 reach the

VPOR33 and VPOR5 minimums respectively.

VDD33_LAG —1.0V

9 Absolute value of slew rate on power supply pins — — 50 V/ms

Required gain at Tj:

IDD  IVRCCTL (@ fsys = fMAX)6, 8, 9, 10

– 55o C7

BETA11

70 — —

– 40o C70——

25o C85

11 ——

150o C 10511 500 —

1The internal POR signals are VPOR15, VPOR33, and VPOR5. On power up, assert RESET before the internal POR negates.

RESET must remain asserted until the power supplies are within the operating conditions as specified in Ta b l e 9 DC Electrical

Specifications. On power down, assert RESET before any power supplies fall outside the operating conditions and until the

internal POR asserts.

2VIL_S (Ta b l e 9 , Spec15) is guaranteed to scale with VDDEH6 down to VPOR5.

3Supply full operating current for the 1.5 V supply when the 3.3 V supply reaches this range.

4It is possible to reach the current limit during ramp up—do not treat this event as short circuit current.

5At peak current for device.

6Requires compliance with Freescale’s recommended board requirements and transistor recommendations. Board signal

traces/routing from the VRCCTL package signal to the base of the external pass transistor and between the emitter of the pass

transistor to the VDD package signals must have a maximum of 100 nH inductance and minimal resistance

(less than 1 ). VRCCTL must have a nominal 1 F phase compensation capacitor to ground. VDD must have a 20 F (nominal)

bulk capacitor (greater than 4 F over all conditions, including lifetime). Place high-frequency bypass capacitors consisting of

eight 0.01 F, two 0.1 F, and one 1 F capacitors around the package on the VDD supply signals.

7Only available on devices that support -55o C.

8IVRCCTL is measured at the following conditions: VDD = 1.35 V, VRC33 = 3.1 V, VVRCCTL = 2.2 V.

9Refer to Ta b l e 1 for the maximum operating frequency.

10 Values are based on IDD from high-use applications as explained in the IDD Electrical Specification.

11 BETA represents the worst-case external transistor. It is measured on a per-part basis and calculated as (IDD  IVRCCTL).

Table 6. VRC and POR Electrical Specifications (continued)

Spec Characteristic Symbol Min. Max. Units

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 11

Furthermore, when all of the PORs negate, the system clock starts to toggle, adding another large increase

of the current consumed by VRC33. If VRC33 lags VDDSYN by more than 100 mV, the increase in current

consumed can drop VDD low enough to assert the 1.5 V POR again. Oscillations are possible when the

1.5 V POR asserts and stops the system clock, causing the voltage on VDD to rise until the 1.5 V POR

negates again. All oscillations stop when VRC33 is powered sufficiently.

When powering down, VRC33 and VDDSYN have no delta requirement to each other, because the bypass

capacitors internal and external to the device are already charged. When not powering up or down, no delta

between VRC33 and VDDSYN is required for the VRC to operate within specification.

There are no power up/down sequencing requirements to prevent issues such as latch-up, excessive current

spikes, and so on. Therefore, the state of the I/O pins during power up and power down varies depending

on which supplies are powered.

Table 7 gives the pin state for the sequence cases for all pins with pad type pad_fc (fast type).

Table 8 gives the pin state for the sequence cases for all pins with pad type pad_mh (medium type) and

pad_sh (slow type).

The values in Table 7 and Table 8 do not include the effect of the weak-pull devices on the output pins

during power up.

Before exiting the internal POR state, the voltage on the pins go to a high-impedance state until POR

negates. When the internal POR negates, the functional state of the signal during reset applies and the

weak-pull devices

(up or down) are enabled as defined in the device reference manual. If VDD is too low to correctly

propagate the logic signals, the weak-pull devices can pull the signals to VDDE and VDDEH.

Table 7. Pin Status for Fast Pads During the Power Sequence

VDDE VDD33 VDD POR

Pin Status for Fast Pad Output Driver

pad_fc (fast)

Low — — Asserted Low

VDDE Low Low Asserted High

VDDE Low VDD Asserted High

VDDE VDD33 Low Asserted High impedance (Hi-Z)

VDDE VDD33 VDD Asserted Hi-Z

VDDE VDD33 VDD Negated Functional

Table 8. Pin Status for Medium and Slow Pads During the Power Sequence

VDDEH VDD POR

Pin Status for Medium and Slow Pad Output Driver

pad_mh (medium) pad_sh (slow)

Low — Asserted Low

VDDEH Low Asserted High impedance (Hi-Z)

VDDEH VDD Asserted Hi-Z

VDDEH VDD Negated Functional

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor12

To avoid this condition, minimize the ramp time of the VDD supply to a time period less than the time

required to enable the external circuitry connected to the device outputs.

During initial power ramp-up, when Vstby is 0.6v or above. a typical current of 1-3mA and maximum of

4mA may be seen until VDD is applied. This current will not reoccur until Vstby is lowered below Vstby

min. specification.

Figure 2 shows an approximate interpolation of the ISTBY worst-case specification to estimate values at

different voltages and temperatures. The vertical lines shown at 25 C, 60 C, and 150 C in Figure 2 are

the actual IDD_STBY specifications (27d) listed in Table 9.

Figure 2. fISTBY Worst-case Specifications

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 13

3.7.1 Input Value of Pins During POR Dependent on VDD33

When powering up the device, VDD33 must not lag the latest VDDSYN or RESET power pin (VDDEH6) by

more than the VDD33 lag specification listed in Table 6, spec 8. This avoids accidentally selecting the

bypass clock mode because the internal versions of PLLCFG[0:1] and RSTCFG are not powered and

therefore cannot read the default state when POR negates. VDD33 can lag VDDSYN or the RESET power

pin (VDDEH6), but cannot lag both by more than the VDD33 lag specification. This VDD33 lag specification

applies during power up only. VDD33 has no lead or lag requirements when powering down.

3.7.2 Power-Up Sequence (VRC33 Grounded)

The 1.5 V VDD power supply must rise to 1.35 V before the 3.3 V VDDSYN power supply and the RESET

power supply rises above 2.0 V. This ensures that digital logic in the PLL for the 1.5 V power supply does

not begin to operate below the specified operation range lower limit of 1.35 V. Because the internal 1.5 V

POR is disabled, the internal 3.3 V POR or the RESET power POR must hold the device in reset. Since

they can negate as low as 2.0 V, VDD must be within specification before the 3.3 V POR and the RESET

POR negate.

Figure 3. Power-Up Sequence (VRC33 Grounded)

3.7.3 Power-Down Sequence (VRC33 Grounded)

The only requirement for the power-down sequence with VRC33 grounded is if VDD decreases to less than

its operating range, VDDSYN or the RESET power must decrease to less than 2.0 V before the VDD power

increases to its operating range. This ensures that the digital 1.5 V logic, which is reset only by an ORed

POR and can cause the 1.5 V supply to decrease less than its specification value, resets correctly. See

Table 6, footnote 1.

VDDSYN and RESET Power

VDD

2.0 V

1.35 V

VDD must reach 1.35 V before VDDSYN and the RESET power reach 2.0 V

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor14

3.8 DC Electrical Specifications

Table 9. DC Electrical Specifications (TA = TL to TH)

Spec Characteristic Symbol Min Max. Unit

1 Core supply voltage (average DC RMS voltage) VDD 1.35 1.65 V

2 Input/output supply voltage (fast input/output) 1VDDE 1.62 3.6 V

3 Input/output supply voltage (slow and medium input/output) VDDEH 3.0 5.25 V

4 3.3 V input/output buffer voltage VDD33 3.0 3.6 V

5 Voltage regulator control input voltage VRC33 3.0 3.6 V

6 Analog supply voltage 2VDDA 4.5 5.25 V

8 Flash programming voltage 3VPP 4.5 5.25 V

9 Flash read voltage VFLASH 3.0 3.6 V

10 SRAM standby voltage 4VSTBY 0.8 1.2 V

11 Clock synthesizer operating voltage VDDSYN 3.0 3.6 V

12 Fast I/O input high voltage VIH_F 0.65  VDDE VDDE + 0.3 V

13 Fast I/O input low voltage VIL_F VSS – 0.3 0.35  VDDE V

14 Medium and slow I/O input high voltage VIH_S 0.65  VDDEH VDDEH + 0.3 V

15 Medium and slow I/O input low voltage VIL_S VSS – 0.3 0.35  VDDEH V

16 Fast input hysteresis VHYS_F 0.1  VDDE V

17 Medium and slow I/O input hysteresis VHYS_S 0.1  VDDEH V

18 Analog input voltage VINDC VSSA – 0.3 VDDA + 0.3 V

19 Fast output high voltage (IOH_F = –2.0 mA) VOH_F 0.8  VDDE —V

20 Slow and medium output high voltage

IOH_S = –2.0 mA

IOH_S = –1.0 mA

VOH_S 0.80  VDDEH

0.85  VDDEH

—V

21 Fast output low voltage (IOL_F = 2.0 mA) VOL_F —0.2  VDDE V

22 Slow and medium output low voltage

IOL_S = 2.0 mA

IOL_S = 1.0 mA

VOL_S

—

0.20  VDDEH

0.15  VDDEH

23 Load capacitance (fast I/O) 5

DSC (SIU_PCR[8:9]) = 0b00

= 0b01

= 0b10

= 0b11

—

24 Input capacitance (digital pins) CIN —7pF

25 Input capacitance (analog pins) CIN_A —10pF

26 Input capacitance:

(Shared digital and analog pins AN[12]_MA[0]_SDS,

AN[13]_MA[1]_SDO, AN[14]_MA[2]_SDI, and AN[15]_FCK)

CIN_M —12pF

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 15

27a Operating Current 1.5 V Supplies @ 132 MHz: 6

VDD (including VDDF max current) @1.65 V typical use 7, 8

VDD (including VDDF max current) @1.4 V typical use 7, 8

VDD (including VDDF max current) @1.65 V high use 8, 9

VDD (including VDDF max current) @1.4 V high use 8, 9

IDD

—

700

600

875

740

27b Operating Current 1.5 V Supplies @ 114 MHz: 6

VDD (including VDDF max current) @1.65 V typical use 7, 8

VDD (including VDDF max current) @1.4 V typical use 7, 8

VDD (including VDDF max current) @1.65 V high use 8, 9

VDD (including VDDF max current) @1.4 V high use 8, 9

IDD

—

609

522

760

643

27c Operating Current 1.5 V Supplies @ 82 MHz: 6

VDD (including VDDF max current) @1.65 V typical use 7, 8

VDD (including VDDF max current) @1.40 V typical use 7, 8

VDD (including VDDF max current) @1.65 V high use 8, 9

VDD (including VDDF max current) @1.40 V high use 8, 9

IDD

—

446

384

555

471

27d RAM standby current.10

IDD_STBY @ 25o C

VSTBY @ 0.8 V

VSTBY @ 1.0 V

VSTBY @ 1.2 V

IDD_STBY @ 60o C

VSTBY @ 0.8 V

VSTBY @ 1.0 V

VSTBY @ 1.2 V

IDD_STBY @ 150o C (Tj)

VSTBY @ 0.8 V

VSTBY @ 1.0 V

VSTBY @ 1.2 V

IDD_STBY

—

100

200

1200

1500

2000

A

28 Operating current 3.3 V supplies @ fMAX MHz

VDD33 11 IDD_33 — 2 + (values

derived from

procedure of

footnote 11)

VFLASH IVFLASH —10mA

VDDSYN IDDSYN —15mA

29 Operating current 5.0 V supplies (12 MHz ADCLK):

VDDA (VDDA0 + VDDA1)

Analog reference supply current (VRH, VRL)

VPP

IDD_A

IREF

IPP

—

20.0

1.0

25.0

Table 9. DC Electrical Specifications (TA = TL to TH) (continued)

Spec Characteristic Symbol Min Max. Unit

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor16

30 Operating current VDDE supplies: 12

VDDEH1

VDDE2

VDDE3

VDDEH4

VDDE5

VDDEH6

VDDE7

VDDEH8

VDDEH9

IDD1

IDD2

IDD3

IDD4

IDD5

IDD6

IDD7

IDD8

IDD9

—

Refer to

footnote 12

31 Fast I/O weak pullup current 13

1.62–1.98 V

2.25–2.75 V

3.00–3.60 V

IACT_F

110

130

170

A

Fast I/O weak pulldown current 13

1.62–1.98 V

2.25–2.75 V

3.00–3.60 V

100

130

170

A

32 Slow and medium I/O weak pullup/down current 13

3.0–3.6 V

4.5–5.5 V

IACT_S 10

150

170

A

33 I/O input leakage current 14 IINACT_D –2.5 2.5 A

34 DC injection current (per pin) IIC –2.0 2.0 mA

35 Analog input current, channel off 15 IINACT_A –150 150 nA

35a Analog input current, shared analog / digital pins

(AN[12], AN[13], AN[14], AN[15]) IINACT_AD –2.5 2.5 A

36 VSS to VSSA differential voltage 16 V

SS – VSSA –100 100 mV

37 Analog reference low voltage VRL VSSA – 0.1 VSSA + 0.1 V

38 VRL differential voltage VRL – VSSA –100 100 mV

39 Analog reference high voltage VRH VDDA – 0.1 VDDA + 0.1 V

40 VREF differential voltage VRH – VRL 4.5 5.25 V

41 VSSSYN to VSS differential voltage VSSSYN – VSS –50 50 mV

42 VRCVSS to VSS differential voltage VRCVSS – VSS –50 50 mV

43 VDDF to VDD differential voltage VDDF – VDD –100 100 mV

43a VRC33 to VDDSYN differential voltage VRC33 – VDDSYN –0.1 0.1 17 V

44 Analog input differential signal range (with common mode 2.5 V) VIDIFF –2.5 2.5 V

45 Operating temperature range, ambient (packaged) TA = (TL to TH)T

LTHC

46 Slew rate on power-supply pins — — 50 V/ms

1VDDE2 and VDDE3 are limited to 2.25–3.6 V only if SIU_ECCR[EBTS] = 0; VDDE2 and VDDE3 have a range of 1.6–3.6 V if

SIU_ECCR[EBTS] = 1.

Table 9. DC Electrical Specifications (TA = TL to TH) (continued)

Spec Characteristic Symbol Min Max. Unit

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 17

2| VDDA0 – VDDA1 | must be < 0.1 V.

3VPP can drop to 3.0 V during read operations.

4If standby operation is not required, connect VSTBY to ground.

5Applies to CLKOUT, external bus pins, and Nexus pins.

6Maximum average RMS DC current.

7Average current measured on automotive benchmark.

8Peak currents can be higher on specialized code.

9High use current measured while running optimized SPE assembly code with all code and data 100% locked in cache

(0% miss rate) with all channels of the eMIOS and eTPU running autonomously, plus the eDMA transferring data continuously from

SRAM to SRAM. Higher currents are possible if an “idle” loop that crosses cache lines is run from cache. Write code that avoids this

condition.

10 The current specification relates to average standby operation after SRAM has been loaded with data. For power up current see

Section 3.7, “Power-Up/Down Sequencing”, Figure 2.

11 Power requirements for the VDD33 supply depend on the frequency of operation, load of all I/O pins, and the voltages on the I/O

segments. Refer to Ta b l e 1 1 for values to calculate the power dissipation for a specific operation.

12 Power requirements for each I/O segment are dependent on the frequency of operation and load of the I/O pins on a particular I/O

segment, and the voltage of the I/O segment. Refer to Ta b l e 1 0 for values to calculate power dissipation for specific operation. The

total power consumption of an I/O segment is the sum of the individual power consumptions for each pin on the segment.

13 Absolute value of current, measured at VIL and VIH.

14 Weak pullup/down inactive. Measured at VDDE = 3.6 V and VDDEH = 5.25 V. Applies to pad types: pad_fc, pad_sh, and pad_mh.

15 Maximum leakage occurs at maximum operating temperature. Leakage current decreases by approximately one-half for each 8 oC

to 12 oC, in the ambient temperature range of 50 oC to 125 oC. Applies to pad types: pad_a and pad_ae.

16 VSSA refers to both VSSA0 and VSSA1. | VSSA0 – VSSA1 | must be < 0.1 V.

17 Up to 0.6 V during power up and power down.

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor18

3.8.1 I/O Pad Current Specifications

The power consumption of an I/O segment depends on the usage of the pins on a particular segment. The

power consumption is the sum of all output pin currents for a segment. The output pin current can be

calculated from Table 10 based on the voltage, frequency, and load on the pin. Use linear scaling to

calculate pin currents for voltage, frequency, and load parameters that fall outside the values given in

Table 10.

Table 10. I/O Pad Average DC Current (TA = TL to TH)1

1These values are estimates from simulation and are not tested. Currents apply to output pins only.

Spec Pad Type Symbol Frequency

(MHz) Load2 (pF)

2All loads are lumped.

Voltage (V)

Drive Select /

Slew Rate

Control Setting

Current (mA)

Slow IDRV_SH

25 50 5.25 11 8.0

210505.25013.2

3 2 50 5.25 00 0.7

4 2 200 5.25 00 2.4

Medium IDRV_MH

50 50 5.25 11 17.3

620505.25016.5

7 3.33 50 5.25 00 1.1

8 3.33 200 5.25 00 3.9

Fast IDRV_FC

66 10 3.6 00 2.8

10 66 20 3.6 01 5.2

11 66 30 3.6 10 8.5

12 66 50 3.6 11 11.0

13 66 10 1.98 00 1.6

14 66 20 1.98 01 2.9

15 66 30 1.98 10 4.2

16 66 50 1.98 11 6.7

17 56 10 3.6 00 2.4

18 56 20 3.6 01 4.4

19 56 30 3.6 10 7.2

20 56 50 3.6 11 9.3

21 56 10 1.98 00 1.3

22 56 20 1.98 01 2.5

23 56 30 1.98 10 3.5

24 56 50 1.98 11 5.7

25 40 10 3.6 00 1.7

26 40 20 3.6 01 3.1

27 40 30 3.6 10 5.1

28 40 50 3.6 11 6.6

29 40 10 1.98 00 1.0

30 40 20 1.98 01 1.8

31 40 30 1.98 10 2.5

32 40 50 1.98 11 4.0

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 19

3.8.2 I/O Pad VDD33 Current Specifications

The power consumption of the VDD33 supply dependents on the usage of the pins on all I/O segments. The

power consumption is the sum of all input and output pin VDD33 currents for all I/O segments. The output

pin VDD33 current can be calculated from Table 11 based on the voltage, frequency, and load on all fast

(pad_fc) pins. The input pin VDD33 current can be calculated from Table 11 based on the voltage,

frequency, and load on all pad_sh and pad_mh pins. Use linear scaling to calculate pin currents for voltage,

frequency, and load parameters that fall outside the values given in Table 11.

Table 11. VDD33 Pad Average DC Current (TA = TL to TH) 1

1These values are estimated from simulation and not tested. Currents apply to output pins for the fast pads only and to input

pins for the slow and medium pads only.

Spec Pad Type Symbol Frequency

(MHz)

Load 2

(pF)

2All loads are lumped.

VDD33

(V)

VDDE

(V)

Drive

Select

Current

(mA)

Inputs

1SlowI

33_SH 66 0.5 3.6 5.5 NA 0.003

2 Medium I33_MH 66 0.5 3.6 5.5 NA 0.003

Outputs

Fast I33_FC

66 10 3.6 3.6 00 0.35

466203.63.6010.53

566303.63.6100.62

666503.63.6110.79

7 66 10 3.6 1.98 00 0.35

8 66 20 3.6 1.98 01 0.44

9 66 30 3.6 1.98 10 0.53

10 66 50 3.6 1.98 11 0.70

11 56 10 3.6 3.6 00 0.30

12 56 20 3.6 3.6 01 0.45

13 56 30 3.6 3.6 10 0.52

14 56 50 3.6 3.6 11 0.67

15 56 10 3.6 1.98 00 0.30

16 56 20 3.6 1.98 01 0.37

17 56 30 3.6 1.98 10 0.45

18 56 50 3.6 1.98 11 0.60

19 40 10 3.6 3.6 00 0.21

20 40 20 3.6 3.6 01 0.31

21 40 30 3.6 3.6 10 0.37

22 40 50 3.6 3.6 11 0.48

23 40 10 3.6 1.98 00 0.21

24 40 20 3.6 1.98 01 0.27

25 40 30 3.6 1.98 10 0.32

26 40 50 3.6 1.98 11 0.42

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor20

3.9 Oscillator and FMPLL Electrical Characteristics

Table 12. FMPLL Electrical Specifications

(VDDSYN = 3.0–3.6 V; VSS = VSSSYN = 0.0 V; TA = TL to TH)

Spec Characteristic Symbol Minimum Maximum Unit

PLL reference frequency range: 1

Crystal reference

External reference

Dual controller (1:1 mode)

fref_crystal

fref_ext

fref_1:1

fsys  2

MHz

2 System frequency 2fsys f

ICO(MIN)  2RFD fMAX 3MHz

3 System clock period tCYC —1  fsys ns

4 Loss of reference frequency 4fLOR 100 1000 kHz

5 Self-clocked mode (SCM) frequency 5fSCM 7.4 17.5 MHz

EXTAL input high voltage crystal mode 6

All other modes

[dual controller (1:1), bypass, external reference]

VIHEXT

VXTAL + 0.4 V

(VDDE5  2) + 0.4 V

—

EXTAL input low voltage crystal mode 7

All other modes

[dual controller (1:1), bypass, external reference]

VILEXT

—

VXTAL – 0.4 V

(VDDE5 2) – 0.4 V

8XTAL current 8IXTAL 0.8 3 mA

9 Total on-chip stray capacitance on XTAL CS_XTAL —1.5pF

10 Total on-chip stray capacitance on EXTAL CS_EXTAL —1.5pF

11 Crystal manufacturer’s recommended capacitive

load

CLRefer to crystal

specification

Refer to crystal

specification

12 Discrete load capacitance to connect to EXTAL CL_EXTAL —(2  CL) – CS_EXTAL

– CPCB_EXTAL 9

13 Discrete load capacitance to connect to XTAL CL_XTAL —(2  CL) – CS_XTAL

– CPCB_XTAL 9

14 PLL lock time 10 tlpll — 750 s

15 Dual controller (1:1) clock skew

(between CLKOUT and EXTAL) 11, 12

tskew –2 2 ns

16 Duty cycle of reference tDC 40 60 %

17 Frequency unLOCK range fUL –4.0 4.0 % fSYS

18 Frequency LOCK range fLCK –2.0 2.0 % fSYS

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 21

CLKOUT period jitter, measured at fSYS max: 13, 14

Peak-to-peak jitter (clock edge to clock edge)

Long term jitter (averaged over a 2 ms interval)

CJITTER

—

5.0

0.01

fCLKOUT

20 Frequency modulation range limit 15

(do not exceed fsys maximum) CMOD 0.8 2.4 %fSYS

ICO frequency

fico = [fref_crystal  (MFD + 4)] (PREDIV + 1) 16

fico = [fref_ext  (MFD + 4) ] (PREDIV + 1)

fico 48 fMAX MHz

22 Predivider output frequency (to PLL) fPREDIV 420

17 MHz

1Nominal crystal and external reference values are worst-case not more than 1%. The device operates correctly if the frequency

remains within ± 5% of the specification limit. This tolerance range allows for a slight frequency drift of the crystals over time.

The designer must thoroughly understand the drift margin of the source clock.

2All internal registers retain data at 0 Hz.

3Up to the maximum frequency rating of the device (refer to Tabl e 1).

4Loss of reference frequency is defined as the reference frequency detected internally, which transitions the PLL into self-clocked

mode.

5The PLL operates at self-clocked mode (SCM) frequency when the reference frequency falls below fLOR. SCM frequency is

measured on the CLKOUT ball with the divider set to divide-by-two of the system clock.

NOTE: In SCM, the MFD and PREDIV have no effect and the RFD is bypassed.

6Use the EXTAL input high voltage parameter when using the FlexCAN oscillator in crystal mode (no quartz crystals or

resonators). (Vextal – Vxtal) must be  400 mV for the oscillator’s comparator to produce the output clock.

7Use the EXTAL input low voltage parameter when using the FlexCAN oscillator in crystal mode (no quartz crystals or

resonators). (Vxtal –V

extal) must be 400 mV for the oscillator’s comparator to produce the output clock.

8Ixtal is the oscillator bias current out of the XTAL pin with both EXTAL and XTAL pins grounded.

9CPCB_EXTAL and CPCB_XTAL are the measured PCB stray capacitances on EXTAL and XTAL, respectively.

10 This specification applies to the period required for the PLL to relock after changing the MFD frequency control bits in the

synthesizer control register (SYNCR). From power up with crystal oscillator reference, the lock time also includes the crystal

startup time.

11 PLL is operating in 1:1 PLL mode.

12 VDDE = 3.0–3.6 V.

13 Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum fsys.

Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise

injected into the PLL circuitry via VDDSYN and VSSSYN and variation in crystal oscillator frequency increase the jitter percentage

for a given interval. CLKOUT divider is set to divide-by-two.

14 Values are with frequency modulation disabled. If frequency modulation is enabled, jitter is the sum of (jitter + Cmod).

15 Modulation depth selected must not result in fsys value greater than the fsys maximum specified value.

16 fsys = fico  (2RFD).

17 Maximum value for dual controller (1:1) mode is (fMAX 2) with the predivider set to 1 (FMPLL_SYNCR[PREDIV] = 0b001).

Table 12. FMPLL Electrical Specifications (continued)

(VDDSYN = 3.0–3.6 V; VSS = VSSSYN = 0.0 V; TA = TL to TH)

Spec Characteristic Symbol Minimum Maximum Unit

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor22

3.10 eQADC Electrical Characteristics

Table 13. eQADC Conversion Specifications (TA = TL to TH)

Spec Characteristic Symbol Minimum Maximum Unit

1 ADC clock (ADCLK) frequency 1

1Conversion characteristics vary with FADCLK rate. Reduced conversion accuracy occurs at maximum FADCLK rate. The

maximum value is based on 800 KS/s and the minimum value is based on 20 MHz oscillator clock frequency divided by a

maximum 16 factor.

FADCLK 112MHz

Conversion cycles

Differential

Single ended

13 + 2 (15)

14 + 2 (16)

13 + 128 (141)

14 + 128 (142)

ADCLK

cycles

3 Stop mode recovery time 2

2Stop mode recovery time begins when the ADC control register enable bits are set until the ADC is ready to perform

conversions.

TSR 10 — s

4 Resolution 3

3At VRH – VRL = 5.12 V, one least significant bit (LSB) = 1.25, mV = one count.

—1.25 — mV

5 INL: 6 MHz ADC clock INL6 –4 4 Counts 3

6 INL: 12 MHz ADC clock INL12 –8 8 Counts

7 DNL: 6 MHz ADC clock DNL6 –3 4

4Guaranteed 10-bit mono tonicity.

3 4Counts

8 DNL: 12 MHz ADC clock DNL12 –6 46 4Counts

9 Offset error with calibration OFFWC –4 5

5The absolute value of the offset error without calibration  100 counts.

4 5Counts

10 Full-scale gain error with calibration GAINWC –8 6

6The absolute value of the full scale gain error without calibration  120 counts.

8 6Counts

11 Disruptive input injection current 7, 8, 9, 10

7Below disruptive current conditions, the channel being stressed has conversion values of: 0x3FF for analog inputs greater than

VRH, and 0x000 for values less than VRL. This assumes that VRH  VDDA and VRL  VSSA due to the presence of the sample

amplifier. Other channels are not affected by non-disruptive conditions.

8Exceeding the limit can cause a conversion error on both stressed and unstressed channels. Transitions within the limit do not

affect device reliability or cause permanent damage.

9Input must be current limited to the value specified. To determine the value of the required current-limiting resistor, calculate

resistance values using VPOSCLAMP = VDDA + 0.5 V and VNEGCLAMP = – 0.3 V, then use the larger of the calculated values.

10 This condition applies to two adjacent pads on the internal pad.

IINJ –1 1 mA

Incremental error due to injection current. All channels are

10 k < Rs <100 k

Channel under test has Rs = 10 k,

IINJ = IINJMAX, IINJMIN

EINJ –4 4 Counts

13 Total unadjusted error (TUE) for single ended conversions

with calibration 11, 12, 13, 14, 15

11 The TUE specification is always less than the sum of the INL, DNL, offset, and gain errors due to canceling errors.

12 TUE does not apply to differential conversions.

13 Measured at 6 MHz ADC clock. TUE with a 12 MHz ADC clock is: –16 counts < TUE < 16 counts.

14 TUE includes all internal device errors such as internal reference variation (75% Ref, 25% Ref).

15 Depending on the input impedance, the analog input leakage current (Ta b l e 9 . DC Electrical Specifications, spec 35a) can

affect the actual TUE measured on analog channels AN[12], AN[13], AN[14], AN[15].

TUE –4 4 Counts

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 23

3.11 H7Fa Flash Memory Electrical Characteristics

Table 14. Flash Program and Erase Specifications (TA = TL to TH)

Spec Flash Program Characteristic Symbol Min. Typical 1

1Typical program and erase times are calculated at 25 oC operating temperature using nominal supply values.

Initial

Max. 2

2Initial factory condition: 100program/erase cycles, 25 oC, using a typical supply voltage measured at a minimum system

frequency of 80 MHz.

Max. 3

3The maximum erase time occurs after the specified number of program/erase cycles. This maximum value is characterized

but not guaranteed.

Unit

3 Doubleword (64 bits) program time 4

4Actual hardware programming times. This does not include software overhead.

Tdwprogram — 10 — 500 s

4 Page program time 4Tpprogram — 22 44 5

5Page size is 256 bits (8 words).

500 s

7 16 KB block pre-program and erase time T16kpperase — 265 400 5000 ms

9 48 KB block pre-program and erase time T48kpperase — 345 400 5000 ms

10 64 KB block pre-program and erase time T64kpperase — 415 500 5000 ms

8 128 KB block pre-program and erase time T128kpperase — 500 1250 7500 ms

11 Minimum operating frequency for program and erase

operations 6

6The read frequency of the flash can range up to the maximum operating frequency. There is no minimum read frequency

condition.

—25———MHz

Table 15. Flash EEPROM Module Life (TA = TL to TH)

Spec Characteristic Symbol Min. Typical 1

1Typical endurance is evaluated at 25o C. Product qualification is performed to the minimum specification. For additional

information on the Freescale definition of typical endurance, refer to engineering bulletin EB619 Typical Endurance for

Nonvolatile Memory.

Unit

1a Number of program/erase cycles per block for 16 KB, 48 KB, and

64 KB blocks over the operating temperature range (TJ)P/E 100,000 — cycles

1b Number of program/erase cycles per block for 128 KB blocks over the

operating temperature range (TJ)P/E 1000 100,000 cycles

Data retention

Blocks with 0–1,000 P/E cycles

Blocks with 1,001–100,000 P/E cycles

Retention

—

years

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor24

Table 16 shows the FLASH_BIU settings versus frequency of operation. Refer to the device reference

manual for definitions of these bit fields.

3.12 AC Specifications

3.12.1 Pad AC Specifications

Table 16. FLASH_BIU Settings vs. Frequency of Operation 1

1Illegal combinations exist. Use entries from the same row in this table.

Maximum Frequency (MHz) APC RWSC WWSC DPFEN 2

2For maximum flash performance, set to 0b11.

IPFEN 2PFLIM 3

3For maximum flash performance, set to 0b110.

BFEN 4

4For maximum flash performance, set to 0b1.

Up to and including 82 MHz 5

582 MHz parts allow for 80 MHz system clock + 2% frequency modulation (FM).

0b001 0b001 0b01 0b00

0b01

0b11

0b00

0b01

0b11

0b000

0b110

0b0

0b1

Up to and including 102 MHz 6

6102 MHz parts allow for 100 MHz system clock + 2% FM.

0b001 0b010 0b01 0b00

0b01

0b11

0b00

0b01

0b11

0b000

0b110

0b0

0b1

Up to and including 132 MHz 7

7132 MHz parts allow for 128 MHz system clock + 2% FM.

0b010 0b011 0b01 0b00

0b01

0b11

0b00

0b01

0b11

0b000

0b110

0b0

0b1

Default setting after reset 0b111 0b111 0b11 0b00 0b00 0b000 0b0

Table 17. Pad AC Specifications (VDDEH = 5.0 V, VDDE = 1.8 V) 1

Spec Pad SRC / DSC

(binary)

Out Delay 2, 3, 4

(ns)

Rise / Fall 4, 5

(ns)

Load Drive

(pF)

1 Slow high voltage (SH)

11 26 15 50

82 60 200

01 75 40 50

137 80 200

00 377 200 50

476 260 200

2 Medium high voltage (MH)

11 16 8 50

43 30 200

01 34 15 50

61 35 200

00 192 100 50

239 125 200

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 25

3Fast

3.1

2.7 10

01 2.5 20

10 2.4 30

11 2.3 50

4 Pullup/down (3.6 V max) — — 7500 50

5 Pullup/down (5.5 V max) — — 9000 50

1These are worst-case values that are estimated from simulation (not tested). The values in the table are simulated at:

VDD = 1.35–1.65 V; VDDE = 1.62–1.98 V; VDDEH = 4.5–5.25 V; VDD33 and VDDSYN = 3.0–3.6 V; and TA=T

Lto TH.

2This parameter is supplied for reference and is guaranteed by design (not tested).

3The output delay is shown in Figure 4. To calculate the output delay with respect to the system clock,

add a maximum of one system clock to the output delay.

4The output delay and rise and fall are measured to 20% or 80% of the respective signal.

5This parameter is guaranteed by characterization rather than 100% tested.

Table 18. Derated Pad AC Specifications (VDDEH = 3.3 V, VDDE = 3.3 V) 1

1These are worst-case values that are estimated from simulation (not tested). The values in the table are simulated at:

VDD = 1.35–1.65 V; VDDE = 3.0–3.6 V; VDDEH = 3.0–3.6 V; VDD33 and VDDSYN = 3.0–3.6 V; and TA = TL to TH.

Spec Pad SRC/DSC

(binary)

Out Delay 2, 3, 4

(ns)

2This parameter is supplied for reference and guaranteed by design (not tested).

Rise / Fall 3, 5

(ns)

Load Drive

(pF)

1 Slow high voltage (SH)

11 39 23 50

120 87 200

01 101 52 50

188 111 200

00 507 248 50

597 312 200

2 Medium high voltage (MH)

11 23 12 50

64 44 200

01 50 22 50

90 50 200

00 261 123 50

305 156 200

3Fast

3.2

2.4 10

01 2.2 20

10 2.1 30

11 2.1 50

4 Pullup/down (3.6 V max) — — 7500 50

5 Pullup/down (5.5 V max) — — 9500 50

Table 17. Pad AC Specifications (VDDEH = 5.0 V, VDDE = 1.8 V) 1 (continued)

Spec Pad SRC / DSC

(binary)

Out Delay 2, 3, 4

(ns)

Rise / Fall 4, 5

(ns)

Load Drive

(pF)

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor26

Figure 4. Pad Output Delay

3.13 AC Timing

3.13.1 Reset and Configuration Pin Timing

3The output delay, and the rise and fall, are calculated to 20% or 80% of the respective signal.

4The output delay is shown in Figure 4. To calculate the output delay with respect to the system clock, add a maximum of one

system clock to the output delay.

5This parameter is guaranteed by characterization rather than 100% tested.

Table 19. Reset and Configuration Pin Timing 1

1Reset timing specified at: VDDEH = 3.0–5.25 V and TA = TL to TH.

Spec Characteristic Symbol Min. Max. Unit

1 RESET pulse width tRPW 10 — tCYC

2 RESET glitch detect pulse width tGPW 2—t

CYC

3 PLLCFG, BOOTCFG, WKPCFG, RSTCFG setup time to RSTOUT valid tRCSU 10 — tCYC

4 PLLCFG, BOOTCFG, WKPCFG, RSTCFG hold time from RSTOUT valid tRCH 0—t

CYC

VDD 2

VOH

VOL

Rising-edge

out delay

Falling-edge

Pad

internal data

Pad

output

out delay

input signal

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 27

Figure 5. Reset and Configuration Pin Timing

3.13.2 IEEE 1149.1 Interface Timing

Table 20. JTAG Pin AC Electrical Characteristics 1

1These specifications apply to JTAG boundary scan only. JTAG timing specified at: VDDE = 3.0–3.6 V and TA = TL to TH.

Refer to Ta b l e 2 1 for Nexus specifications.

Spec Characteristic Symbol Min. Max. Unit

1 TCK cycle time tJCYC 100 — ns

2 TCK clock pulse width (measured at VDDE  2) tJDC 40 60 ns

3 TCK rise and fall times (40% to 70%) tTCKRISE —3ns

4 TMS, TDI data setup time tTMSS, tTDIS 5—ns

5 TMS, TDI data hold time tTMSH, tTDIH 25 — ns

6 TCK low to TDO data valid tTDOV —20ns

7 TCK low to TDO data invalid tTDOI 0—ns

8 TCK low to TDO high impedance tTDOHZ —20ns

9 JCOMP assertion time tJCMPPW 100 — ns

10 JCOMP setup time to TCK low tJCMPS 40 — ns

11 TCK falling-edge to output valid tBSDV —50ns

12 TCK falling-edge to output valid out of high impedance tBSDVZ —50ns

13 TCK falling-edge to output high impedance (Hi-Z) tBSDHZ —50ns

14 Boundary scan input valid to TCK rising-edge tBSDST 50 — ns

15 TCK rising-edge to boundary scan input invalid tBSDHT 50 — ns

RESET

RSTOUT

WKPCFG

PLLCFG

BOOTCFG

RSTCFG

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor28

Figure 6. JTAG Test Clock Input Timing

Figure 7. JTAG Test Access Port Timing

TCK

TMS, TDI

TDO

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 29

Figure 8. JTAG JCOMP Timing

TCK

JCOMP

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor30

Figure 9. JTAG Boundary Scan Timing

TCK

Output

signals

Input

signals

Output

signals

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 31

3.13.3 Nexus Timing

Figure 10. Nexus Output Timing

Table 21. Nexus Debug Port Timing 1

1JTAG specifications apply when used for debug functionality. All Nexus timing relative to MCKO is measured from 50% of

MCKO and 50% of the respective signal. Nexus timing specified at VDD = 1.35–1.65 V, VDDE = 2.25–3.6 V,

VDD33 and VDDSYN = 3.0–3.6 V, TA = TL to TH, and CL = 30 pF with DSC = 0b10.

Spec Characteristic Symbol Min. Max. Unit

1 MCKO cycle time tMCYC 22

2The Nexus AUX port runs up to 82 MHz.

CYC

2 MCKO duty cycle tMDC 40 60 %

3 MCKO low to MDO data valid 3

3MDO, MSEO, and EVTO data is held valid until the next MCKO low cycle occurs.

tMDOV –1.5 3.0 ns

4 MCKO low to MSEO data valid 3tMSEOV –1.5 3.0 ns

5 MCKO low to EVTO data valid 3tEVTOV –1.5 3.0 ns

6 EVTI pulse width tEVTIPW 4.0 — tTCYC

7 EVTO pulse width tEVTOPW 1—t

MCYC

8 TCK cycle time tTCYC 4 4

4Limit the maximum frequency to approximately 16 MHz (VDDE = 2.25–3.0 V) or 20 MHz (VDDE = 3.0–3.6 V) to meet the timing

specification for tJOV of [0.2 x tJCYC] as outlined in the IEEE-ISTO 5001-2003 specification.

—t

CYC

9 TCK duty cycle tTDC 40 60 %

10 TDI, TMS data setup time tNTDIS, tNTMSS 8—ns

11 TDI, TMS data hold time tNTDIH, tNTMSH 5—ns

TCK low to TDO data valid tJOV

VDDE = 2.25–3.0 V 0 12 ns

VDDE = 3.0–3.6 V 0 10 ns

13 RDY valid to MCKO 5

5The RDY pin timing is asynchronous to MCKO and is guaranteed by design to function correctly.

————

MCKO

MDO

MSEO

EVTO

Output Data Valid

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor32

Figure 11. Nexus TDI, TMS, TDO Timing

TDO

TMS, TDI

TCK

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 33

3.13.4 External Bus Interface (EBI) Timing

Table 22 lists the timing information for the external bus interface (EBI).

Table 22. Bus Operation Timing1

Spec

Characteristic

and

Description

Symbol

External Bus Frequency 2, 3

Unit Notes

40 MHz 56 MHz 66 MHz

Min. Max. Min. Max. Min. Max.

1 CLKOUT period TC24.4 — 17.5 — 15.2 — ns Signals are measured

at 50% VDDE.

2 CLKOUT duty cycle tCDC 45% 55% 45% 55% 45% 55% TC

3 CLKOUT rise time tCRT ——

4——

4ns

4 CLKOUT fall time tCFT ——

4——

4ns

CLKOUT positive edge to output

signal invalid or Hi-Z (hold time)

External bus interface

BG 5

BR 6

CS[0:3]

ADDR[8:31]

DATA[0:31] 7

BDIP

RD_WR

TEA 8

TSIZ[0:1]

WE/BE[0:3] 9

tCOH 1.010

1.5

—

1.010

1.5

—

1.010

1.5

—ns

EBTS = 0

EBTS = 1

Hold time selectable

via SIU_ECCR

[EBTS] bit.

CLKOUT positive edge to output

signal valid (output delay)

External bus interface

BG 5

BR 6

CS[0:3]

ADDR[8:31]

DATA[0:31] 7

BDIP

RD_WR

TEA 8

TSIZ[0:1]

WE/BE[0:3] 9

tCOV

—

10.010

11.0

—

7.510

8.5

—

6.010

7.0

EBTS = 0

EBTS = 1

Output valid time

selectable via

SIU_ECCR

[EBTS] bit.

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor34

Input signal valid to CLKOUT

positive edge (setup time)

External bus interface

ADDR[8:31]

DATA[0:31] 7

BG 6

BR 5

RD_WR

TEA 8

tCIS 10.0 — 7.0 — 5.0 — ns

CLKOUT positive edge to input

signal invalid (hold time)

External bus interface

ADDR[8:31]

DATA[0:31] 7

BG 6

BR 5

RD_WR

TEA 8

tCIH 1.0 — 1.0 — 1.0 — ns

1EBI timing specified at: VDDE = 1.6–3.6 V (unless stated otherwise); TA = TL to TH; and CL = 30 pF with DSC = 0b10.

2Speed is the nominal maximum frequency. Max. speed is the maximum speed allowed including frequency modulation (FM).

82 MHz parts allow for 80 MHz system clock + 2% FM; 114 MHz parts allow for 112 MHz system clock + 2% FM; and

132 MHz parts allow for 128 MHz system clock + 2% FM.

3The external bus is limited to half the speed of the internal bus.

4Refer to fast pad timing in Ta b l e 1 7 and Ta b l e 1 8 (different values for 1.8 V and 3.3 V).

5Internal arbitration.

6External arbitration.

7Due to pin limitations, the DATA[16:31] signals are not available on the 324 package.

8Due to pin limitations, the TEA signal is not available on the 324 package.

9Due to pin limitations, the WE/BE[2:3] signals are not available on the 324 package.

10 SIU_ECCR[EBTS] = 0 timings are tested and valid at VDDE = 2.25–3.6 V only; SIU_ECCR[EBTS] = 1 timings are tested and

valid at VDDE = 1.6–3.6 V.

Table 22. Bus Operation Timing1 (continued)

Spec

Characteristic

and

Description

Symbol

External Bus Frequency 2, 3

Unit Notes

40 MHz 56 MHz 66 MHz

Min. Max. Min. Max. Min. Max.

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 35

Figure 12. CLKOUT Timing

Figure 13. Synchronous Output Timing

CLKOUT

VDDE 2

Vol_f

Voh_f

CLKOUT

bus

Output

signal

Output

DDE



DDE



DDE



DDE



Output

signal V

DDE



MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor36

Figure 14. Synchronous Input Timing

3.13.5 External Interrupt Timing (IRQ Signals)

Table 23. External Interrupt Timing 1

1IRQ timing specified at: VDDEH = 3.0–5.25 V and TA = TL to TH.

Spec Characteristic Symbol Min. Max. Unit

1 IRQ pulse-width low tIPWL 3—t

CYC

2 IRQ pulse-width high TIPWH 3—t

CYC

3 IRQ edge-to-edge time 2

2Applies when IRQ signals are configured for rising-edge or falling-edge events, but not both.

tICYC 6—t

CYC

CLKOUT

Input

bus

Input

signal

VDDE 2

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 37

Figure 15. External Interrupt Timing

3.13.6 eTPU Timing

Figure 16. eTPU Timing

Table 24. eTPU Timing 1

1eTPU timing specified at: VDDEH = 3.0–5.25 V and TA = TL to TH.

Spec Characteristic Symbol Min. Max Unit

1 eTPU input channel pulse width tICPW 4—t

CYC

2 eTPU output channel pulse width tOCPW 2 2

2This specification does not include the rise and fall times. When calculating the minimum eTPU pulse width, include the rise

and fall times defined in the slew rate control fields (SRC) of the pad configuration registers (PCR).

—t

CYC

IRQ

eTPU

output

eTPU input

and TCRCLK

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor38

3.13.7 eMIOS Timing

Figure 17. eMIOS Timing

3.13.8 DSPI Timing

Table 25. eMIOS Timing 1

1eMIOS timing specified at: VDDEH = 3.0–5.25 V and TA = TL to TH.

Spec Characteristic Symbol Min. Max. Unit

1 eMIOS input pulse width tMIPW 4—t

CYC

2 eMIOS output pulse width tMOPW 1 2

2This specification does not include the rise and fall times. When calculating the minimum eMIOS pulse width, include the rise

and fall times defined in the slew rate control field (SRC) in the pad configuration register (PCR).

—t

CYC

Table 26. DSPI Timing1’ 2

Spec Characteristic Symbol

80 MHz 112 MHz 132 MHz

Unit

Min. Max. Min. Max. Min. Max.

1 SCK cycle time3, 4 tSCK 24.4 ns 2.9 ms 17.5 ns 2.1 ms 15.2 ns 1.7 ms —

2 PCS to SCK delay5tCSC 23 — 15 — 13 — ns

3 After SCK delay6tASC 22 — 14 — 12 — ns

4SCK duty cycle tSDC

(tSCK  2)

– 2 ns

(tSCK  2)

+ 2 ns

(tSCK  2)

– 2 ns

(tSCK  2)

+ 2 ns

(tSCK  2)

– 2 ns

(tSCK  2)

+ 2 ns ns

5Slave access time

(SS active to SOUT driven) tA—25 —25 —25 ns

6Slave SOUT disable time

(SS inactive to SOUT Hi-Z, or invalid) tDIS —25 —25 —25 ns

7PCSx to PCSS time tPCSC 4—4—4—ns

8PCSS

to PCSx time tPASC 5—5—5—ns

eMIOS

output

eMIOS input

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 39

Data setup time for inputs

Master (MTFE = 0)

Slave

Master (MTFE = 1, CPHA = 0)7

Master (MTFE = 1, CPHA = 1)

tSUI

–4

—

Data hold time for inputs

Master (MTFE = 0)

Slave

Master (MTFE = 1, CPHA = 0)7

Master (MTFE = 1, CPHA = 1)

tHI

–4

—

–4

—

–4

—

Data valid (after SCK edge)

Master (MTFE = 0)

Slave

Master (MTFE = 1, CPHA = 0)

Master (MTFE = 1, CPHA = 1)

tSUO

—

Data hold time for outputs

Master (MTFE = 0)

Slave

Master (MTFE = 1, CPHA = 0)

Master (MTFE = 1, CPHA = 1)

tHO

–5

5.5

–5

—

–5

5.5

–5

—

–5

5.5

–5

—

1All DSPI timing specifications use the fastest slew rate (SRC = 0b11) on pad type M or MH. DSPI signals using pad types

of S or SH have an additional delay based on the slew rate. DSPI timing is specified at: VDDEH = 3.0–5.25 V;TA = TL to TH;

and CL = 50 pF with SRC = 0b11.

2Speed is the nominal maximum frequency. Max. speed is the maximum speed allowed including frequency modulation (FM).

82 MHz parts allow for 80 MHz system clock + 2% FM; 114 MHz parts allow for 112 MHz system clock + 2% FM; and

132 MHz parts allow for 128 MHz system clock + 2% FM.

3The minimum SCK cycle time restricts the baud rate selection for the given system clock rate.

These numbers are calculated based on two MPC55xx devices communicating over a DSPI link.

4The actual minimum SCK cycle time is limited by pad performance.

5The maximum value is programmable in DSPI_CTARx[PSSCK] and DSPI_CTARx[CSSCK].

6The maximum value is programmable in DSPI_CTARx[PASC] and DSPI_CTARx[ASC].

7This number is calculated using the SMPL_PT field in DSPI_MCR set to 0b10.

Table 26. DSPI Timing1’ 2 (continued)

Spec Characteristic Symbol

80 MHz 112 MHz 132 MHz

Unit

Min. Max. Min. Max. Min. Max.

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor40

Figure 18. DSPI Classic SPI Timing—Master, CPHA = 0

Figure 19. DSPI Classic SPI Timing—Master, CPHA = 1

Data Last data

First data

First data Data Last data

SIN

SOUT

PCSx

SCK output

(CPOL=0)

(CPOL=1)

Data Last data

First data

SIN

SOUT

12 11

Last data

Data

First data

SCK output

PCSx

(CPOL=0)

(CPOL=1)

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 41

Figure 20. DSPI Classic SPI Timing—Slave, CPHA = 0

Figure 21. DSPI Classic SPI Timing—Slave, CPHA = 1

Last data

First data

Data

SIN

SOUT

5 6

SCK input

First data Last data

SCK input

(CPOL=0)

(CPOL=1)

5 6

Last data

SIN

SOUT

First data

Data

SCK input

(CPOL=0)

(CPOL=1)

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor42

Figure 22. DSPI Modified Transfer Format Timing—Master, CPHA = 0

Figure 23. DSPI Modified Transfer Format Timing—Master, CPHA = 1

PCSx

12 11

SCK output

SIN

SOUT

First data Data Last data

(CPOL=0)

(CPOL=1)

PCSx

12 11

SCK output

SIN

SOUT

First data Data Last data

(CPOL=0)

(CPOL=1)

Electrical Characteristics

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 43

Figure 24. DSPI Modified Transfer Format Timing—Slave, CPHA = 0

Figure 25. DSPI Modified Transfer Format Timing—Slave, CPHA = 1

Figure 26. DSPI PCS Strobe (PCSS) Timing

Last data

First data

Data

SIN

SOUT

5 6

SCK input

First data Last data

SCK input

(CPOL=0)

(CPOL=1)

5 6

Last data

SIN

SOUT

First data

Data

SCK input

(CPOL=0)

(CPOL=1)

PCSx

PCSS

MPC5554 Microcontroller Data Sheet, Rev. 4

Electrical Characteristics

Freescale Semiconductor44

3.13.9 eQADC SSI Timing

Figure 27. EQADC SSI Timing

Table 27. EQADC SSI Timing Characteristics

Spec Rating Symbol Minimum Typical Maximum Unit

2 FCK period (tFCK = 1  fFCK) 1, 2

1SS timing specified at VDDEH = 3.0–5.25 V, TA = TL to TH, and CL = 25 pF with SRC = 0b11. Maximum operating frequency

varies depending on track delays, master pad delays, and slave pad delays.

2FCK duty cycle is not 50% when it is generated through the division of the system clock by an odd number.

tFCK 2— 17t

SYS_CLK

3 Clock (FCK) high time tFCKHT tSYS_CLK  6.5 — 9  (tSYS_CLK  6.5) ns

4 Clock (FCK) low time tFCKLT tSYS_CLK  6.5 — 8  (tSYS_CLK  6.5) ns

5 SDS lead / lag time tSDS_LL –7.5 — +7.5 ns

6 SDO lead / lag time tSDO_LL –7.5 — +7.5 ns

7 EQADC data setup time (inputs) tEQ_SU 22 — — ns

8 EQADC data hold time (inputs) tEQ_HO 1— — ns

1st (MSB) 2nd

25th

26th

1st (MSB) 2nd 25th 26th

FCK

SDS

SDO

External device data sample at

SDI

EQADC data sample at

FCK falling-edge

FCK rising-edge

Mechanicals

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 45

4 Mechanicals

4.1 MPC5553546667 416 PBGA Pinout

Figure 28, Figure 29, and Figure 30 show the pinout for the MPC5553546667 416 PBGA package. The

alternate Fast Ethernet Controller (FEC) signals are multiplexed with the data calibration bus signals.

NOTE

The MPC5500 devices are pin compatible for software portability and use

the primary function names to label the pins in the BGA diagram. Although

some devices do not support all the primary functions shown in the BGA

diagram, the muxed and GPIO signals on those pins remain available. See

the signals chapter in the device reference manual for the signal muxing.

Figure 28. MPC5553546667 416 Package

VSS

1 2 3 4 5 6 7 8 9 1011121314151617181920212223242526

AN35

VSTBY AN37 AN11 VDDA1 AN16 AN5 VRH AN23 AN27 AN28 VSSA0 AN15 MDO11 MDO8 VDD VDD33 VSS

VDD AN32

VSS AN36 AN39 AN19 AN20 AN4 AN22 AN26 AN31 VSSA0 AN14 MDO10 MDO7 MDO4 MDO0 VSS VDDE7

VDD33 AN33

VDD VSS AN8 AN17 VSSA1 AN3 AN7 VRL AN25 AN30 VDDA0 AN13 MDO9 MDO6 MDO3 MDO1 VSS VDDE7 VDD

AN34

VDD VSS AN38 AN9 AN18 AN2 AN6 AN24 AN29 AN12 MDO5 MDO2 VSS VDDE7 TCK TDI

VDD VDDE7 TMS TDO TEST

MSEO0 JCOMP EVTI EVTO

MSEO1 MCKO

RDY

VSSVSS VSS VSS VDDE7 VDDE7 VDDE7 VDDE7

VSSVSS VSS VSS VSS VSS VSS VDDE7

VSSVDDE2 VDDE2 VSS VSS VSS VSS VDDE7 SINB

BDIP VSS

TEA VDDE2 VDDE2 VSS VSS VSS VSS VDDE7 SOUTB PCSB3 PCSB0 PCSB1

CS3 VSS

CS2 CS1 CS0 VDDE2 VDDE2 VSS VSS VSS VSS VSS PCSA3 PCSB4 SCKB PCSB2

WE3 VSS

WE2 WE1 WE0 VDDE2 VDDE2 VSS VSS VSS VSS VSS PCSB5 SOUTA SINA SCKA

VDDE2 VDDE2

TSIZ0 RD_WR VDDE2 VDDE2 VSS VDDE2 VDDE2 VDDE2 VSS VSS PCSA1 PCSA0 PCSA2 VPP

VDDE2

TSIZ1 TA VDD33 VSS VDDE2 VDDE2 VDDE2 VDDE2 VSS VSS PCSA4 TXDA PCSA5 VFLASH

TS CNTXC RXDA

RSTOUT

RXDB CNRXC TXDB RESET

VDDE2Y

EXTAL

VDDE2 VDD XTAL

VDDE2

VSS VDD VDDE2 VDDE5 NC VSS VDD VRC33

VSS VDD VDD33 CNTXA VDDE5 NC VSS VDD VDD33

VSS VDD OE BG CNRXA VDDE5 CLKOUT VSS VDD

VSS VDD VDDE2 VDDE2 BB CNTXB CNRXB VDDE5 VSS

1 2 3 4 5 6 7 8 9 1011121314151617181920212223242526

AN10

AN21

AN0

AN1 ETRIG

ETPUB

GPIO

205

ETRIG

ETPUB

ETPUA

VDDEH

ETPUB

VDDEH

ETPUA

VDDEH

ETPUA

TCRCLK

VDDEH

GPIO

204

ETPUB

GPIO

203

ETPUB

TCRCLK

ADDR

DATA

GPIO

207

GPIO

206

DATA

EMIOS

VDDEH

BOOT

CFG1

VDDEH

PLL

CFG1

BOOT

CFG0

WKP

CFG

VRC

VSS

SYN

VRC

CTL

PLL

CFG0

VDD

SYN

RST

CFG

ENG

CLK

Note: No connect. AC22 & AD23 reserved

REF

BYPC

MPC5554 Microcontroller Data Sheet, Rev. 4

Mechanicals

Freescale Semiconductor46

Figure 29. MPC5553546667 416 Package Left Side (view 1 of 2)

VSS

12345678910111213

AN35

VSTBY AN37 AN11 VDDA1 AN16 AN5 VRH AN23 AN27 AN28

VDD AN32

VSS AN36 AN39 AN19 AN20 AN4 AN22 AN26 AN31

VDD33 AN33

VDD VSS AN8 AN17 VSSA1 AN3 AN7 VRL AN25 AN30

AN34

VDD VSS AN38 AN9 AN18 AN2 AN6 AN24 AN29

VDDE

VSSVSS VSS VSS

VSSVDDE2 VDDE2 VSS

BDIP VSS

TEA VDDE2 VDDE2 VSS

CS3 VSS

CS2 CS1 CS0 VDDE2 VDDE2 VSS

WE3 VSS

WE2 WE1 WE0 VDDE2 VDDE2 VSS

VDDE2 VDDE2

TSIZ0 RD_WR VDDE2 VDDE2 VSS VDDE2

VDDE2

TSIZ1 TA VDD33 VSS VDDE2 VDDE2

TSV

VDDE2Y

VDDE2AB

VDDE2

VSS VDD VDDE2

VSS VDD VDD33

VSS VDD OE

VSS VDD VDDE2 VDDE2

12345678910111213

AN10

AN21

AN0

AN1

ETPUA

VDDEH

ETPUA

VDDEH

ETPUA

TCRCLK

ADDR

DATA

GPIO

207

GPIO

206

DATA

REF

BYPC

Mechanicals

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 47

Figure 30. MPC5553546667 416 Package Right Side (view 2 of 2)

Figure 31. MPC5567 416 Package

14 15 16 17 18 19 20 21 22 23 24 25 26

VSSA0 AN15 MDO11 MDO8 VDD VDD33 VSS

VSSA0 AN14 MDO10 MDO7 MDO4 MDO0 VSS VDDE7

VDDA0 AN13 MDO9 MDO6 MDO3 MDO1 VSS VDDE7 VDD

AN12 MDO5 MDO2 VSS VDDE7 TCK TDI

VDDE7 TMS TDO TEST

MSEO0 JCOMP EVTI EVTO

MSEO1 MCKO

RDY

VDDE7 VDDE7 VDDE7 VDDE7

VSS VSS VSS VDDE7

VSS VSS VSS VDDE7 SINB

VSS VSS VSS VDDE7 SOUTB PCSB3 PCSB0 PCSB1

VSS VSS VSS VSS PCSA3 PCSB4 SCKB PCSB2

VSS VSS VSS VSS PCSB5 SOUTA SINA SCKA

VDDE2 VDDE2 VSS VSS PCSA1 PCSA0 PCSA2 VPP

VDDE2 VDDE2 VSS VSS PCSA4 TXDA PCSA5 VFLASH

CNTXC RXDA

RSTOUT

RXDB CNRXC TXDB RESET

EXTAL

VDD XTAL

VDDE5 NC VSS VDD VRC33

CNTXA VDDE5 NC VSS VDD VDD33

BG CNRXA VDDE5 CLKOUT VSS VDD

BB CNTXB CNRXB VDDE5 VSS

14 15 16 17 18 19 20 21 22 23 24 25 26

ETRIG

ETPUB

GPIO

205

ETRIG

ETPUB

VDDEH

ETPUB

VDDEH

GPIO

204

ETPUB

GPIO

203

ETPUB

TCRCLK

DATA

EMIOS

VDDEH

BOOT

CFG1

VDDEH

PLL

CFG1

BOOT

CFG0

WKP

CFG

VRC

VSS

SYN

VRC

CTL

PLL

CFG0

VDD

SYN

RST

CFG

ENG

CLK

Note: No connect. AC22 & AD23 reserved

MPC5554 Microcontroller Data Sheet, Rev. 4

Mechanicals

Freescale Semiconductor48

The package drawings of the MPC55 208-pin MAP BGA are shown below.

Figure 32. 208-Pin Package

Mechanicals

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 49

Figure 32. MPC55 208 MAP BGA Package (continued)

MPC5554 Microcontroller Data Sheet, Rev. 4

Mechanicals

Freescale Semiconductor50

The package drawings of the 324-pin TEPBGA package are shown in Figure 33.

Figure 33. 324 TEPBGA Package

Mechanicals

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 51

Figure 33. 324 TEPBGA Package (continued)

MPC5554 Microcontroller Data Sheet, Rev. 4

Mechanicals

Freescale Semiconductor52

4.2 MPC5554 416-Pin Package Dimensions

The package drawings of the MPC5554 416 pin TEPBGA package are shown in Figure 34.

Figure 34. MPC5554 416 TEPBGA Package

Mechanicals

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 53

Figure 34. MPC5554 416 TEPBGA Package (continued)

MPC5554 Microcontroller Data Sheet, Rev. 4

Revision History for the MPC5554 Data Sheet

Freescale Semiconductor54

5 Revision History for the MPC5554 Data Sheet

The history of revisions made to this data sheet are described in this section.

5.1 Changes between Revision 3 and Revision 4

5.2 Changes between Revision 2 and Revision 3

The substantive changes incorporated in MPC5554 Data Sheet Rev. 2.0 to produce Rev. 3.0 are listed in

Table 28. The changes are listed in sequential page number order.

Location Description of Changes

Section 3.7, “Power-Up/Down

Sequencing”

Added the following paragraph in Section 3.7, “Power-Up/Down Sequencing”:

“During initial power ramp-up, when Vstby is 0.6v or above. a typical current of 1-3mA and

maximum of 4mA may be seen until VDD is applied. This current will not reoccur until Vstby is

lowered below Vstby min. specification”.

Moved Figure 2 (fISTBY Worst-case Specifications) “ISTBY Worst-case Specifications” to

Section 3.7, “Power-Up/Down Sequencing”.

Section 3.8, “DC Electrical

Specifications”

Removed the footnote “Figure 3 shows an illustration of the IDD_STBY values interpolated for

these temperature values”.

Changed the footnote attached to IDD_STBY” to “The current specification relates to average

standby operation after SRAM has been loaded with data. For power up current see

Section 3.7, “Power-Up/Down Sequencing”,Figure 2 (fISTBY Worst-case Specifications).”

In Table 9 (DC Electrical Specifications (TA = TL to TH)) the Characteristic “Refer to Figure 3 for

an interpolation of this data” changed to “RAM standby current”.

Table 28. Changes Between Rev. 2.0 and 3.0

Location Description of Changes

Throughout:

Changed ‘TA = TL – TH’ to ‘TA = TL to TH.’

Title page:

Changed the Revision number from 2 to 3. Changed the date. Made the same change in the lower left corner of the

back page.

Section 1, “Overview”

• Fourth paragraph, First sentence: Deleted ‘of the MPC5500 family’; Second to last sentence: Deleted ‘can’.

• Fifth paragraph, First sentence: Replaced ‘MPC5500 family’ with ‘MPC5554’; Last sentence: Replaced ‘can be’

with ‘is’.

• Sixth paragraph, First sentence: Replaced ‘MPC5500 family’ with ‘MPC5554’;

• Second to last paragraph: Rewrote to read: The MCU has an on-chip enhanced queued dual analog-to-digital

converter (eQADC). The 416 package has 40-channels.

Section 3.2.1, “General Notes for Specifications at Maximum Junction Temperature

Upd at ed the a dd res s o f S em ico nd uct or Eq ui pme nt a nd Ma te ria ls I nt er nati o na l

3081 Zanker Rd.

San Jose, CA., 95134

(408) 943-6900

Revision History for the MPC5554 Data Sheet

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 55

Section 3.7, “Power-Up/Down Sequencing

Last paragraph: Changed the first sentence FROM , , , the voltage on the pins goes to high-impedance until . . .

TO. . .the pins go to a high-impedance state until . . .

Section 3.7.3, “Power-Down Sequence (VRC33 Grounded)”

Last sentence: Changed from: ‘This ensures that the digital 1.5 V logic, which is reset by the ORed POR only and

can cause the 1.5 V supply to decrease below its specification, is reset properly.’

To: ‘This ensures that the digital 1.5 V logic, which is reset only by an ORed POR and can cause the 1.5 V supply

to decrease less than its specification, resets correctly.’

Section 4.1, “MPC5553546667 416 PBGA Pinout”

Added the following NOTE before the 416 BGA Map:

NOTE

The MPC5500 devices are pin compatible for software portability and use the primary

function names to label the pins in the BGA diagram. Although some devices do not support

all the primary functions shown in the BGA diagram, the muxed and GPIO signals on those

pins remain available. See the signals chapter in the device reference manual for the signal

muxing.

Table 5 (ESD Ratings ,) ESD Ratings:

Changed footnote 2 from:

• ‘Device failure is defined as: ‘If after exposure to ESD pulses, the device no longer meets the device specification

requirements. Complete DC parametric and functional testing will be performed per applicable device

specification at room temperature followed by hot temperature, unless specified otherwise in the device

specification.’

to:

• Device failure is defined as: ‘If after exposure to ESD pulses, the device does not meet the device specification

requirements, which includes the complete DC parametric and functional testing at room temperature and hot

temperature.

Tabl e 6 (VRC and POR Electrical Specifications) VCR/POR Electrical Specifications:

• Added footnote 1 to specs 1, 2, and 3 that reads: The internal POR signals are VPOR15, VPOR33, and VPOR5.

On power up, assert RESET before the internal POR negates. RESET must remain asserted until the power

supplies are within the operating conditions as specified in Ta b l e 9 DC Electrical Specifications. On power down,

assert RESET before any power supplies fall outside the operating conditions and until the internal POR asserts.

• Reformatted columns.

Table 9 (DC Electrical Specifications (TA = TL to TH)) DC Electrical Specifications:

• Added footnote that reads: VDDE2 and VDDE3 are limited to 2.25–3.6 V only if SIU_ECCR[EBTS] = 0; VDDE2 and

VDDE3 have a range of 1.6–3.6 V if SIU_ECCR[EBTS] =1.

• Added (TA = TL to TH) to the table title.

Table 14 (Flash Program and Erase Specifications (TA = TL to TH)) Flash Program and Erase Specifications (TA = TL to TH)

• Footnote 1, Changed ‘Typical program and erase times assume nominal supply values and operation at 25 oC’

to ‘Typical program and erase times are calculated at 25 oC operating temperature using nominal supply values..’

Table 17 (Pad AC Specifications (VDDEH = 5.0 V, VDDE = 1.8 V)) Pad AC Specifications (VDDEH = 5.0 V, VDDE = 1.8 V)

• Footnote 1, changed ‘VDDEH = 4.5–5.5;’ to ‘VDDEH = 4.5–5.25;’

Table 19 (Reset and Configuration Pin Timing) Reset and Configuration Pin Timing:

• Footnote 1: Removed VDD = 1.35–1.65 V.

Table 28. Changes Between Rev. 2.0 and 3.0 (continued)

Location Description of Changes

MPC5554 Microcontroller Data Sheet, Rev. 4

Revision History for the MPC5554 Data Sheet

Freescale Semiconductor56

Table 20 (JTAG Pin AC Electrical Characteristics) JTAG Pin AC Electrical Characteristics

• Footnote 1: Removed VDD = 1.35–1.65 V, and VDD33 and VDDSYN = 3.0–3.6 V.

Table 22 (Bus Operation Timing) Bus Operation Timing:

• External Bus Frequency in the table heading: Added footnote that reads: Speed is the nominal maximum

frequency. Max speed is the maximum speed allowed including frequency modulation (FM). 82 MHz parts allow

for 80 MHz system clock + 2% FM; 114 MHz parts allow for 112 MHz system clock + 2% FM; and 132 MHz parts

allow for 128 MHz system clock + 2% FM.

• Specifications 5, 6, 7, and 8: Reordered the EBI signals within each specification.

• Specifications 7 and 8: Removed EBI signals BDIP

, OE, TSIZ[0:1], WE/BE[0:3].

• Footnote 1: Removed VDD = 1.35–1.65 V, and VDD33 and VDDSYN = 3.0–3.6 V.

• Footnote 8: Changed EBTS to SIU_ECCR[EBTS].

Table 23 (External Interrupt Timing) External Interrupt Timing (IRQ Signals)

• Footnote 1: Removed VDD = 1.35–1.65 V; changed VDDEH = 3.0–5.5 V to VDDEH = 3.0–5.25 V.

Table 24 (eTPU Timing) eTPU Timing

• Footnote 1: Changed VDDEH = 3.0–5.5 V to VDDEH = 3.0–5.25 V.

Table 25 (eMIOS Timing) eMIOS Timing

• Footnote 1: Changed VDDEH = 3.0–5.5 V to VDDEH = 3.0–5.25 V.

Table 26 (DSPI Timing’) DSPI Timing:

• Footnote 1, changed ‘VDDEH = 3.0–5.5 V;’ to ‘VDDEH = 3.0–5.25 V;’

• Table Title: Added footnote that reads: Speed is the nominal maximum frequency. Max speed is the maximum

speed allowed including frequency modulation (FM). 82 MHz parts allow for 80 MHz system clock + 2% FM;

114 MHz parts allow for 112 MHz system clock + 2% FM; and 132 MHz parts allow for

128 MHz system clock + 2% FM.

• Spec 1: SCK cycle time; Changed to 80 MHz minimum column from 25 to 24.4; 112 MHz minimum column from

17.9 to 17.5; 112 MHz maximum column from 2.0 to 2.1.

Table 27 (EQADC SSI Timing Characteristics) EQADC SSI Timing Characteristics

• Footnote 1: Changed VDDEH = 3.0–5.5 V to VDDEH = 3.0–5.25 V.

Table 28. Changes Between Rev. 2.0 and 3.0 (continued)

Location Description of Changes

MPC5554 Microcontroller Data Sheet, Rev. 4

Freescale Semiconductor 57

THIS PAGE IS INTENTIONALLY BLANK

Document Number: MPC5554

Rev. 4

5/2012

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