LMP7721
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SNOSAW6E –JANUARY 2008–REVISED DECEMBER 2014
6.5 Electrical Characteristics: 2.5 V
Unless otherwise specified, all limits are specified for TA= 25°C, V+= 2.5 V, V−= 0 V, VCM = (V++ V−)/2.
PARAMETER TEST CONDITIONS MIN(1) TYP(2) MAX(1) UNIT
VOS Input Offset Voltage –180 ±50 180 μV
–40°C ≤TJ≤125°C –480 480
TC VOS Input Offset Voltage Drift –1.5 –4 μV/°C
(3)
IBIAS Input Bias Current VCM = 1 V(4) (5) 25°C –20 ±3 20 fA
−40°C to 85°C –900 900
−40°C to 125°C –5 5 pA
IOS Input Offset Current VCM = 1 V(5) ±6 ±40 fA
CMRR Common-Mode Rejection Ratio 0 V ≤VCM ≤1.4 V 83 100 dB
0 V ≤VCM ≤1.4 V, –40°C ≤TJ≤125°C 80
PSRR Power Supply Rejection Ratio 1.8 V ≤V+≤5.5 V, V−= 0 V, VCM = 0 84 92 dB
1.8 V ≤V+≤5.5 V, V−= 0 V, VCM = 0, 80
–40°C ≤TJ≤125°C
CMVR Input Common-Mode Voltage CMRR ≥80 dB −0.3 1.5 V
Range CMRR ≥78 dB, –40°C ≤TJ≤125°C –0.3 1.5
AVOL Large Signal Voltage Gain VO= 0.15 V to 2.2 V, RL= 2 kΩto V+/2 88 107
VO= 0.15 V to 2.2 V, RL= 2 kΩto V+/2, 82
–40°C ≤TJ≤125°C dB
VO= 0.15 V to 2.2 V, RL= 10 kΩto V+/2 92 120
VO= 0.15 V to 2.2 V, RL= 10 kΩto V+/2, 88
–40°C ≤TJ≤125°C
VOOutput Swing High RL= 2 kΩto V+/2 70 25
RL= 2 kΩto V+/2, –40°C ≤TJ≤125°C 77 mV
from V+
RL= 10 kΩto V+/2 60 20
RL= 10 kΩto V+/2, –40°C ≤TJ≤125°C 66
Output Swing Low RL= 2 kΩto V+/2 30 70
RL= 2 kΩto V+/2, –40°C ≤TJ≤125°C 73 mV
RL= 10 kΩto V+/2 15 60
RL= 10 kΩto V+/2, –40°C ≤TJ≤125°C 62
IOOutput Short Circuit Current Sourcing to V−, VIN = 200 mV (6) 36 46
Sourcing to V−, VIN = 200 mV (6), –40°C ≤30
TJ≤125°C mA
Sinking to V+, VIN =−200 mV (6) 7.5 15
Sinking to V+, VIN =−200 mV (6), –40°C ≤5.0
TJ≤125°C
ISSupply Current 1.1 1.5 mA
–40°C ≤TJ≤125°C 1.75
SR Slew Rate AV= +1, Rising (10% to 90%) 9.3 V/μs
AV= +1, Falling (90% to 10%) 10.8
GBW Gain Bandwidth Product 15 MHz
enInput-Referred Voltage Noise f = 400 Hz 8 nV/
f = 1 kHz 7
(1) Limits are 100% production tested at 25°C. Limits over the operating temperature range are specified through correlations using the
Statistical Quality Control (SQC) method.
(2) Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary
over time and will also depend on the application and configuration. The typical values are not tested and are not specified on shipped
production material.
(3) Offset voltage average drift is determined by dividing the change in VOS at the temperature extremes by the total temperature change.
(4) Positive current corresponds to current flowing into the device.
(5) This parameter is specified by design and/or characterization and is not tested in production.
(6) The short circuit test is a momentary open loop test.
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