SiS606BDN
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S17-1638-Rev. A, 30-Oct-17 2Document Number: 76792
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Notes
a. Pulse test; pulse width 300 μs, duty cycle 2 %
b. Guaranteed by design, not subject to production testing
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
SPECIFICATIONS (TJ = 25 °C, unless otherwise noted)
PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT
Static
Drain-source breakdown voltage VDS VGS = 0 V, ID = 250 μA 100 - - V
VDS temperature coefficient VDS/TJID = 10 mA - 81 - mV/°C
VGS(th) temperature coefficient VGS(th)/TJID = 250 μA - -7.5 -
Gate-source threshold voltage VGS(th) VDS = VGS, ID = 250 μA 2 - 4 V
Gate-source leakage IGSS VDS = 0 V, VGS = ± 20 V - - 100 nA
Zero gate voltage drain current IDSS
VDS = 100 V, VGS = 0 V - - 1 μA
VDS = 100 V, VGS = 0 V, TJ = 70 °C - - 15
On-state drain current aID(on) VDS 10 V, VGS = 10 V 40 - - A
Drain-source on-state resistance aRDS(on)
VGS = 10 V, ID = 10 A - 0.0145 0.0174
VGS = 7.5 V, ID = 10 A - 0.0158 0.0205
Forward transconductance agfs VDS = 15 V, ID = 10 A - 46 - S
Dynamic b
Input capacitance Ciss
VDS = 50 V, VGS = 0 V, f = 1 MHz
- 1470 -
pFOutput capacitance Coss - 132 -
Reverse transfer capacitance Crss - 11.2 -
Total gate charge Qg
VDS = 50 V, VGS = 10 V, ID = 10 A - 20 30
nCVDS = 50 V, VGS = 7.5 V, ID =10 A
- 15.1 22.7
Gate-source charge Qgs -6.45-
Gate-drain charge Qgd -3.5-
Output charge Qoss VDS = 50 V, VGS = 0 V - 22 -
Gate resistance Rgf = 1 MHz 0.2 0.76 1.4
Turn-on delay time td(on)
VDD = 50 V, RL = 5 , ID 10 A,
VGEN = 10 V, Rg = 1
-1224
ns
Rise time tr-510
Turn-off delay time td(off) -1938
Fall time tf-510
Turn-on delay time td(on)
VDD = 50 V, RL = 5 , ID 10 A,
VGEN = 7.5 V, Rg = 1
-1530
Rise time tr-612
Turn-off delay time td(off) -1938
Fall time tf-510
Drain-Source Body Diode Characteristics
Continuous source-drain diode current ISTC = 25 °C - - 47.2 A
Pulse diode forward current ISM --80
Body diode voltage VSD IS = 5 A, VGS = 0 V - 0.78 1.1 V
Body diode reverse recovery time trr
IF = 10 A, di/dt = 100 A/μs, TJ = 25 °C
-4386ns
Body diode reverse recovery charge Qrr - 72 144 nC
Reverse recovery fall time ta-33-
ns
Reverse recovery rise time tb-10-