MC74AC05, MC74ACT05
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2
MAXIMUM RATINGS
Symbol Parameter Value Unit
VCC DC Supply Voltage *0.5 to )7.0 V
VIDC Input Voltage *0.5 v VI v VCC )0.5 V
VODC Output Voltage (Note 1) *0.5 v VO v VCC )0.5 V
IIK DC Input Diode Current $20 mA
IOK DC Output Diode Current $50 mA
IODC Output Sink/Source Current $50 mA
ICC DC Supply Current per Output Pin $50 mA
IGND DC Ground Current per Output Pin $50 mA
TSTG Storage Temperature Range *65 to )150 °C
TLLead temperature, 1 mm from Case for 10 Seconds 260 °C
TJJunction temperature under Bias )150 °C
qJA Ther mal Resistance (Note 2) SOIC
TSSOP 125
170 °C/W
PDPower Dissipation in Still Air at 85°C SOIC
TSSOP 125
170 mW
MSL Moisture Sensitivity Level 1
FRFlammability Rating Oxygen Index: 30% − 35% UL 94 V−0 @ 0.125 in
VESD ESD Withstand Voltage Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
> 2000
> 200
> 1000
V
ILatch−Up Latch−Up Performance Above VCC and Below GND at 85°C (Note 6) $100 mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be af fected.
1. IO absolute maximum rating must be observed.
2. The package thermal impedance is calculated in accordance with JESD51−7.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Min Typ Min Unit
VCC Supply Voltage ′AC 2.0 5.0 6.0 V
′ACT 4.5 5.0 5.5
VREG DC Regulated Power Voltage (Ref. to GND) 0 − VCC V
tr, tfInput Rise and Fall Time (Note 1)
′AC Devices except Schmitt Inputs
VCC @ 3.0 V − 150 −
VCC @ 4.5 V − 40 − ns/V
VCC @ 5.5 V − 25 −
tr, tfInput Rise and Fall Time (Note 2)
′ACT Devices except Schmitt Inputs VCC @ 4.5 V − 10 − ns/V
VCC @ 5.5 V − 8.0 −
TJJunction Temperature (PDIP) − − 140 °C
TAOperating Ambient Temperature Range −40 25 85 °C
IOH Output Current − HIGH − − −24 mA
IOL Output Current − LOW − − 24 mA
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
1. Vin from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. Vin from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.