SURFACE MOUNT MONOLITHIC CHIP CAPACITORS anata HIGH DIELECTRIC CONSTANT TYPE en fe GRM36/39/40/42-6/42-2/43-2/44-1 Series Rez ee FEATURES es @ Miniature size aes ~ @ No Polarity 956 @ Nickel Barrier Termination Standard highly resistant to re) 2) 7 r metal migration EF fer H Uniform dimensions and configuration & & g a, aw @& @ Suitable for reflow soldering * * & @ ea @ GRM3239, 40 and 42-6 suitable for wave soldering * 2 B Mini ies induct PT inimum series inductance "2 @ Tape and Reel Packaging @ Bulk Case Packaging available for GRM40 and smaller Mf Wide selection of capacitance values and voltages @ Largest production capacity and volume in the world PART NUMBERING SYSTEM GRM40 --- CAPACITOR 3-digit code TEMPERATURE CAPACITANCE CAPACITANCE VOLTAGE MARKING PACKAGING TYPE AND SIZE = appears as CHARACTERISTICS VALUE TOLERANCE Identified by A= Unmarked | See below and necessary X5R Expressed in X7R/X5R: a three-digit following pages. _to indicate X7R picofarads and i" =+10% number. Reel Diameter/ Cod special Y5V identified by a = 20% Tape Material ode thickness three-digit number. Non- andor 7 Paper Tape D requirements. First two digits J=+5% 3 , Please consult represent significant YBV: Z = *80% 7 Plastic Tape L your local sales figures. Last digit 13 Paper Tape J office for details. specifies the number 13 Plastic Tape K of zeros to follow. Bulk B Bulk Cassette c 7 Paper 2mm pitch Q See pages 33-36 for labeling and packaging information. CHIP DIMENSIONS . oe . EIA L Ww T e (min.) g (min.) Dimensions: mm Size Code Length Width Thickness Termination insulation GRM36 0402 1.0 + 0.05 0.5 + 0.05 0.5 + 0.05 0.15 ~ 0.3 0.4 GRM39* 0603 1620.1 0.8+0.1 0.8 + 0.1 0.2 ~ 0.5 0.5 0.6+0.1 e,9 ye GRM40 0805 2.0 +0.1 1.25+0.4 0.85 + 0.1 0.2 ~ 0.7 0.7 1.25 +01 a 0.85 20.1 GRM42-6 | 1206 3.20.15 16 20.15 1.15 + 0.1 0.3 ~0.8 1.5 Pe rae 3.2+0.2 1.6+0.2 1.6+0.2 A UG rt = iee 01 yt ty GAMa2-2 | 1210 | 3.2203 25 +0.2 1.39 + 0.15 0.3 min. 1.0 1.8+0.2 2.5+0.2 GRM43-2 1812 4540.4 3.2 + 0.3 2.0 max. 0.3 min. 2.0 GRM44-1 2220 5.7+0.4 5.0+0.4 2.0 max. 0.3 min. 2.0 *Bulk case packaging is L = 1.6 + 0.07, W, T = 0.8 + 0.07. CHIP TERMINATION DIAGRAMS Nickel Barrier Layer (Standard) GRM Series Ceramic Dielectric Inner Electrode Inner Termination (Ag or Ag/Pd or Cu} Nickel Plated Barrier Layer Tin Plating* *Size 0402 Solder Plated All products on this page are available as standard through authorized Murata Electronics Distributors. CG01-l 13SURFACE MOUNT MONOLITHIC CHIP CAPACITORS HIGH DIELECTRIC CONSTANT TYPE- SPECIFICATION tarovater in Electronics GRM36/39/40/42-6/42-2/43-2/44-1 Series GENERAL/ELECTRICAL Capacitance Change with Temperature: X5R: +15% ACX 55C to +85C X7R: +15% ACX -55C to +125C Y5V; 2 ACX -30C to +85C Capacitance & D.F. (Frequency & Voltage) X5R, X7R: 1kHz 100Hz @ 1.0 +.2Vrms Resistance (I.R.) X5R/X7R 100,000 megohms or 1000 megohms-mfd Insulation (whichever is less) Y5V 10,000 megohms or 500 megahms-mfd (whichever is less) Y5V: 1kHz +100Hz @ 1.0 +.2Vrms Dielectric Strength (Flash) 250% of rated voltage for 5 seconds with series resistor limiting charge current to 50mA max.; Min. 25V 16V 10V 6.3V 200% for 500V og X5R 2.5% 3.5% 3.5% 5% Dissipation Factor (D.F.) X7R 95% 3.5% 35% 5% Typ. Aging (per Decade) Y5R/XTR 3% Y5V 5.0% 9.0% 125% 12.5% Ye. Aging {p YBV 7% MECHANICAL TEST TEST METHOD POST TEST LIMITS Terminal <0603 1.0 Ibs. Adhesion | | Glass epoxy board . 20805 2.2 Ibs. . No evidence of termination peeting Mounting on io 10 Capacitor gag Bie 1 mm deflection (Glass epoxy board) Deflection CS? Se Deflection No mechanical damage Unit: mm mt 45-45 Capacitance meter Cap., DF, IR meet initial limits Supporter Solderabilit MIL-STD-202 Meets Requirement Y Method 208F For specific details contact factory ENVIRONMENTAL TEST TEST METHOD POST TEST LIMITS . Appearance: No visual damage MIL-STD-202, Method 107, Condition A AC: X5R/X7R = +12.5% Prior to starting Thermal Shock test, capacitors shall be heat treated YSV = +30.0% Thermal (deaged) for one (1) hour at 150C. Allow capacitors to stabilize at | D.F: XSR/X7R = 2.5% max. @ 25C, (3.5% max. @ 25C for 16V & 10V Series) Shock room temperature for 48 hours prior to taking initial measurements. (7.5% max. @ 25C for 6.3V Series) (Air to Air) Y5V = 5.0% max. @ 25C, (9.0% max. @ 25C for 16V Series) Post thermal Shock measurement shall be taken after 48 hours (15% max. @ 25C for 10V & 6.3V Series) _ stabilization. I.R.: XSR/X7R = 100,000M0 min. of 1,000MQeF (whichever is less} Y5V = 10,0000 or S0OMQeuF min. (whichever is less) Appearance: No defects Humidity, Maintain the capacitor at 40 + 2C and 90 to 95% humidity for Capacitance: X5R, X7R within +12.5%; Z5U, YSV within +30% Steady 500 + 12 hours. Remove and let sit for 48 + 4 hours at room Q/D.F.: See chart below. State temperature, then measure. |.R.: 1,000MQ, or 500 F (whichever is less) Apply the rated voltage at 40 + 2C and 90 to 95% humidity for Appearance: No defects 500 + 12 hours. Remove and jet sit for 48 + 4 hours at room Capacitance: X5R, X7R within +12.5%; Z5U within +30%; temperature, then measure. The charge/discharge current is YSV within +30/-40% (10Vmax}, within 30% (others) less than 50mA. h - 63 Humidity Load | Initia! measurement for Y5V/10V max. yer: 25V min. 16V 10V WV Apply the rated DC voitage for 1 hour at 40 + 20C. x7R | 0.05 max. 0.05 max. 0.05 max.| 0.075 max. Remove and let sit for 48 + 4 hours at room temperature. Q/D.F. | Z5U | 0.05 max. _ o Perform initial measurement. 0.1 max. (C<T.0u.F) Y5V | 0.075 max. 0.125 max. 0.15 max.) 0.15 max. (C21.0uF) |.R.: 500MO or 250 F (whichever is less) Dielectric Strength: No failure Apply 200% of rated voltage for 1000 + 12 hours at Appearance: No defects : : ENO Capacitance: XSR/X7R + 12.5% ACX, Z5U/V5V +30% ACX maximum operating temperature; 150% for SOOV DF: XSRIX7R = 3.0% max. @ 25C, (5% max. @ 25C for 16V & 10V Series} Life Test (7.5% max. @ 25C for 6.3V Series} . . . Y5V = 7.5% max. @ 25C, (10% max. @ 25C for 16V Series) Upon completion of above test wait 48 hours prior (15% max. @ 25C for 10V & 6.3V Series) to performing post testing. LR: X5B/X7R 1,000M2 or 50MQ-mfd. (whichever is less) Y5V 1,000MQ or 50MQ-mfd. (whichever is less) Flash: 250% rated voltage 14 CG01-ISURFACE MOUNT MONOLITHIC CHIP CAPACITORS ae HIGH DIELECTRIC CONSTANT X5R/X7R/Y5V TYPES jaaRata GRM36/39/40 Series Type (EIA Code) GRM36* (0402) GRM339 (0603) GRM40 (0805) Char. XSR X7R Y5V X7R Y5V X7R YSV Cap. (pF | 10 | 16 | 10 | 16 | 25 | 50) 10) 16] 25 | 0) 10) 16) 25 | 50 |100}200) 10 | 16] 25 | 50 |100) 10 | 16 | 25 | 50 |100/200) 16 25 | 50 |100 SHOLIDVdVD dIHO SIHLIONOW 2] omy av a > ?) m = fe) Lay rd a | 290 Soy foresee yen pte Tp eee CTT pe oor OTA yp 220 Poff Lee PT af LT 330/ | ! I li 390| / | i | 470 [ 560 680 Z so; | | | |, fy To To yy TAR tooo} Pf nk ay TO Co (ey TO fr 7 Sa 1200 1500 1800 2200; | | | | fot fl La fy HL dy] Et _. 2700 3300f Py poppe Ty ppp pe Zi ae 3900 [ft i ft ) of of, rf ft f_{., ae (Ale. 4700; | | | iyi fy ET To] ft ot | Ai 1 A 5600 6800 _ IE | | IT 8200 qoo00; fT yp OP yp yoy yy iaio#g#ft LU ooo. TT 7{ ft i fT [4 Ty ft tft, |_| tT fist mt 15000) Pa Ut IL) 18000 | ] 22000| _ [ tf ff Lit yo TE | jf [fief 27000 ITAL 33000/ | py TT Py ee ee ii | ie Te sooo! | if if | ft |) yf te rf tf tt {_L.. | | T_T 47000| | mie LI PILE | tL seooo/f Ty | 7} |) LOE Py ppp | eT : es000 [fff OO LTT Ole oO 82000 1ooo00 |} |p Pe Or a in VAI i HM 120000 et ttf td ee wet eee JM tp we 4 150000 |] Ca Ce | veeefenee| eee i) |Z 180000 220000 | Coco Ao mole Wo Zn 270000 330000 [77] op (ci ap ici To Qe a 390000, | | | |i. i | tt {| if __ t. fmf Jot 47000 | OTE Ee aD (it Hi 560000 680000 all | g20000( | | | Ty - | 1000000 L| 5000007 {| | { | | | ft) fT TT |) ETE Te af {oto | 2200000/ PF | | . 3300000 4700000 |_ 40000000 *GRM36 Series is suited to only reflow soldering. Type: GRM40-034 (L: 2 + 0.15, W: 1.25 + 0.15, T: 1.25 + 0.15} 2Only for taping . THICKNESS AND PACKAGING TYPES/QUANTITY Type Thickness: T Bulk Taping ; Bulk Case Thickness: T Bulk Taping ; Bulk Case (mm) (pes./bag)| (pes./p>178mm reel) |(pes./case) (mm) (pes./bag)| (pes./b178mm reel) |(pes./case) GRM36 | [ |:0.5+0.05 1000 10000 50000 GRM40 [47A: 0.85 + 0.1 1000 4000 = GRM39 | [_1:0.8+0.14 1000 4000 15000 MM 4.25011 1000 3000 5000 GRM40) (__1:0.6+0.1 1000 4000 10000 | 36330mm reel is available on request. Bulk case packaging is T = 0.8 + 0.07. p----4-----h-----p----4-----f] |b ----4-----b----4.----4-----p----4e---- fd bE ----44q 0 Pp ----b----4--- ef eee debe eed EP----4 Ad -- fb ---- epee ba---4---.-f-----}---- 4 .---}----[--- | ---- fe ---- feb ee fe bee de Type CG01-I 15SURFACE MOUNT MONOLITHIC CHIP CAPACITORS HIGH DIELECTRIC CONSTANT XSR/X7R/YSV TYPES GRM42-6/42-2/43-2/44-1 Series Sanovator in Electronics Type (EIA Code) GRM42-6 (1206) GRM42-2 (1210) GRM43-2 1812) GRM44-1 (2220) Char. X7R X7R X7R Y5V X7R YSV Cap. (pF) Volt. 100000 120000 150000 180000 220000 270000 330000 390000 470000 560000 680000 820000 1000000 4200000 1500000 1800000 2200000 3300000 4700000 10000000 3300 3900 4700 weenebeee--b----4 5600 6800 8200 jp- deed e- eb peep --- + 10000 12000 15000 18000{ 22000 27000 33000 39000 47000 56000 68000 82000 np ---4e---5 ------L, -----4 p----4----- {BY pee G N Type: GRM42-631 (L: 3.2 + 0.2, W: 1.6 20.2, T: 1.379.) THICKNESS AND PACKAGING TYPES/QUANTITY Type Thickness: T (mm) Bulk (pcs. /bag) Taping (pes./b178mm reel)! Type Thickness: T (mm) Bulk (pes./bag) Taping (pes./b178mm reel)! (ZA: 0.85 + 0.1 1000 4000 GRM42-6 MB 1.15201 1000 3000 GRM42-2 IXNY: 1.8 + 0.2 1000 1000 12.5 40.2 1000 1000 BAY: 1.6 + 0.2 1000 2000 GRM43-2 2.0 max. 1000 1000 GRM42-2 MM 1.15201 1000 3000 GRM44-1 [ 2.0 max. 1000 1000 C}: 1.35 + 0.15 1000 2000 16330mm reel is available on request. Note: Capacitance Values = EIA 12 step: X7R = 10,12,15,18,22,27,33,39,47,56,68,82 6 step: Y5V = 10,15,22,33,47,68. For other values contact your local Murata Sales Office 16 CG01-lGRM39X5R105K6.3 http://www .murata.co.jp/Ceramy/owa/CATAL...atalog?sHinnmTmp=GRM39X5R105K6.3&sLang=2 Petree O20] Capacitors > Monolithic Ceramic Capacitors > for Flow/Reflow Soldering Specification |GRM39X5R105K6.3 _[ 1.60mm +0.10mm ~ [| 0.80mm +0.10mm | _|_0.80mm +0.10mm _ [Part Number [Length L [Width Wo [Thickness T |Electrod e | 0.20t00.50mm [Electrode Gap g | 050mm min. ITC Code | X5R [Capacitance Change | +15% ITC Change Correction | "-55 to85C _1.0uF 10% |Temperature ] Range > | | 6.3Vde | | |Capacitance _ [Rated Voltage |Soldering Method FLW / RFLW [Recomended Parts ee EIA 90603 Minimum Quantity [180mm Paper Tape |4000 [180mm Plastic Tape [330mm Paper Tape |10000 330mm Plastic Tape| [Bulk Case [Bulk(Bag) [1000 _ FlatPack | |335Reel [Magazine [Box Details as Dimensions a Feature & Appictn Bc .-Temp.Char. Cap.Chng.-Agin Impdnce.-Freg.Char. 3 Notice (storage and operation condition) z J Notice (rating) #"| Notice (soldering and mounting) a Notice (other) x Specifications Packaging EI Information for Data | Sample Kit Product specifications i in this catalog are as of Fed. 00, anda are e subject to change or obsolescence 1 of2 9/8/00 10:12 AM MURES00461Specifications and Test Methods Specification No. Item Temperature High Dielectric Type Test Method Compensating Type X5R : 55 to +85C Operating _ X7R : 55 to +1250 1 | Temperature 55 to +125 Z5U : +10 to +85 Y5V : 30 to +85C The rated voltage is defined as the maximum voltage which may be . applied continuously to the capacitor. 2 | Rated Voltage See the previous page. When AC voltage is superimposed on DC voltage, V"? or V", whichever is larger, shall be maintained within the rated voltage range. 3 | Appearance No defects or abnormalities. Visual inspection. 4 | Dimensions Within the specified dimensions. Using calipers on micrometer. No failure shall be observed when *300% of the rated voltage (COA to U2J and SL) or *250% of the rated voltage (X5R, X7R, 5 | Dielectric Strength | No defects or abnormaiities. Z5U and Y5V) is applied between the terminations for 1 to 5 seconds, provided the charge/discharge current is less than 50mA. *200% for 500V insulation The insulation resistance shall be measured with a DC voltage 6 . More than 10,000MQ or 500 - F (Whichever is smaller) not exceeding the rated voltage at 25% and 75%RH max. and Resistance sh: : . within 2 minutes of charging. 7 | Capacitance Within the specified tolerance. The capacitance/Q/D.F. shall be measured at 25 at the frequency and voltage shown in the table. Item | Frequency Voltage [XSR,X7R] COA toU2J,SL W.V. : 25Vmin, : 0.025max. (1000pF and 1+0.1MHz | 0.5 to 5Vrms W.V. : 16/10V : 0.035max. below) W.V : 6.3V 0.05max.(C<3.3pF) COA toU2J,SL 0.1max.(C23.3yF) (more than 140.1kHz 1+0.2Vrms a 30pFmin. : @21000 [25U] over pFmin. : : . 8 | Dissipation Factor | 30pFmax. : Q2400+20C ev} 25Vmin. : 0.025max. (vr and wtotke || 1t0.2Veme . . : in . . (D.F.) C : Nominal Capacitance (pF) WV. :25Vmin. below) : 0.05max.(C<10uF) X5R,X7R,Y5V : 0.09max.(C21.0pF seni max(C21.0uF) (more than 120+24Hz | 0.5+0.1Vrms W.V. : 16V 10uF :0.07max.(C<1.0uF) HF) 1 0.09max.(C21.0uF) W.V.: 10Vmax. : 0.125max. Z5U 140.1kHz 0.5+0.05Vrms Capacitance Within the specified tolerance. (Table A) X5R ; Withint15% (-55 to +85C) X7R : Withint15% (-55 to +125) Z5U : Within +22/-56% (+10 to +85) Y5V : Within +22/-82% (~30 to +85) Capacitance Temperature Characteristics Temperature Coefficient Within the specified tolerance. (Table A) The capacitance change shall be measured after 5 Min. at each specified temperature stage. (1) Temperature Compensating Type The temperature coefficient is determined using the Capacitance measured in step 3 as a reference. When cycling the temperature sequentially from step 1 through 5 (COA : +25C to +125 : other temp. coeffs. : +25'C to +85C) the capacitance shall be within the specified tolerance for the temperature coefficient and capacitance change as Table A. The capacitance drift is caluculated by dividing the differences between the maximum and minimum measured values in the step 1,3 and 5 by the cap value in step 3. Step Temperature(C) 1 2542 55+3 (for CA to U2J/SL/X5R/X7R) 2 30+3 (for Y5V) 103 (for Z5U) 3 2542 12543 (for CA/X7R) 85+3 (for other TC) 2542 4 Capacitance Within +0.2% or 0.05pF (Whichever is larger.) *Not apply to SL/25V (2) High Dielectric Constant Type The ranges of capacitance change compared with the above 25C value over the temperature ranges shown in the table shall be within the specified ranges. Continued on the following page.Continued from the preceding page. Specification No. tem Conperttihe, type High Dielectric Type Test Method Solder the capacitor to the test jig (glass epoxy board) shown in Fig.1 using a eutectic solder. Then apply 10N* force in parallel with the test jig for 10+1sec. The soldering shall be done either with an iron or using the reflow method and shall be conducted with care so that the soldering is uniform and gree of defects such as heat shock. *2N (GRM33) 5N (GRM36,GRM39) He 10 Adhesive Strength No removal of the terminations or other defect shall occur. resist of Termination Fig.1 Baked electrode or copper foil c 0.3 0.5 1.2 1.65 2.0 2.9 3.7 5.6 (in mm) Appearance | No defects or abnormalities. Capacitance | Within the specified tolerance. [X5R,X7R} W.V. : 25Vmin. : 0.025max. W.V. : 16/10V : 0.035max. Solder the capacitor to the test jig (glass epoxy board) in the WV. : 6.3V: same manner and under the same conditions as (10). The 0.05max. (C<3.3NF) | capacitor shall be subjected to a simple harmonic motion Vibration 0.1max, (C23.3uF) having a total amplitude of 1.5mm, the frequency being varied 11 : a [25U} uniformly between the approximate limits of 10 and 55Hz. The Resistance 30pFmin. : Q=1000 W.V. : 25Vmin. : 0.025max. f from 10 to 55Hz and return to 10Hz, shall b ay/p.F. | 30pFmax. : Q2400+20C rvsV} requency range, rom o Zan re urn jo z, shall be C : Nominal Capacitance (pF) ; traversed in approximately 1 minute. This motion shail be W.V. : 25Vmin. applied for a period of 2 hours in each 3 mutually perpendicular :0.05max. (C<1.0uF) | directions (total of 6 hours). : 0.09max. (C21.0uF) W.V. : 16V :0.07max. (C<1.0UF) : 0.09max. (C21 .0pF) W.V. : 10Vmax.:0.125max. Solder the capacitor on the test jig (glass epoxy board) shown in Fig.2 using a eutectic solder. Then apply a force in the direc- No crack or marked defect shalll occur. tion shown in Fig. 3. The soldering shail be done either with an iron or using the reflow method and shall be conducted with care so that the soldering is uniform and free of defects such as heat shock. b 04.5 20 450 Pressurizing speed : 1.0mmisec. Pressurize 3 mai Cet ~ = 100 12.| Deflection Flexure : 31 Fig.2 t: 1.6mm (GRM33/36 : 0.8mm) c Fig.3 0.3 0.5 12 1.65 2.0 2.9 3.7 5.6 Continued on the following page.Continued from the preceding page. Specification No. hem Temperature wa. . Test Method Compensating Type High Dielectric Type Immerse the capacitor in a solution of ethanol (JIS-K-8101) and - wo, rosin (JIS-K-5902) (25% rosin in weight propotion). 13 Solderability of 75% of the terminations is to be soldered evenly and Preheat at 80 to 120C for 10 to 30 seconds. After preheating, Termination continuously. . . . . immerse in eutectic solder solution for 240.5 seconds at 230+5'C. The measured and observed characteristics shall satisfy the specifications in the following table. Appearance | No marking defects. Capacitance | Within 42.5% or 0.25pF X5R,X7R : Within +7.5% Change (Whichever is larger) Z5U,YSV : Within 20% Preheat the capacitor at 120 to 150C for 1 minute. [X5R,X7R] Immerse the capacitor in a eutectic solder solution at 270+5C W.V.: 25Vmin. : 0.025max. for 10+0.5 seconds. Let sit at room temperature for 24+2 hours W.V. : 16/10V : 0.035max. (temperature compensating type) or 4844 hours (high dielectric WV. :6.3V: constant type), then measure. 0.05max. (C<3.3uF) Resistance 0.4max. (C23.3pF) eInitial measurement for high dielectric constant type 14 to ; [Z5U] Perform a heat treatment at 1500 for one hour and then let Soldering /0.F 30pFmin. : Q21000 W.V. : 25Vmmin. : 0.025max. sit for 4844 hours at room temperature. Heat Q/D.F. | 30pFmax. : Q2400+20C rvs] Perform the initial measurement. C:Nomina! Capacitance (pF) WV. : 25Vmin. :0.05max. (C<1.0pF) *Preheating for GRM42-2/43-2/44-1 > 0.09max. (C21.0puF) Step Temperature Time W.V.:16V 1 100T to 120% 1 min, : 0.07max. (C<1.0UF) 170 to 200% 1 min. 2 0.09max. (C21.0pF) W.V. : 10Vmax. : 0.125max. LR. More than 10,000MQ or 500QF (Whichever is smaller) Dielectric No fait Strength lo failure The measured and observed characteristics shall safisfy the specifications in the following table. Appearance | No marking defects. Cepactace | Within +2.5% or +0.25pF X5R,X7R : Within +7.5% ; ; oo Change (Whichever is larger) Z5U,Y5V : Within 20% Fix the capacitor to the supporting jig in the same manner and under the same conditions as (10). Perform the five cycles [X5R,X7R] ; according to the four heat treatments listed in the following W.V. : 25min. : 0.025max. table. Let sit for 242 hours (temperature compensating type) W.V. : 16/10V:0.035max. or 48:4 hour (high dielectric constant type) at room W.V. 5 6.3V temperature, then measure. 0.05max. (C<3.3uF) 1 sul 0.1max. (C23.3yF) Step 1 2 3 4 1s] 30pFmin. : Q21000 Min. Max. a : in. : Temp. . Room : Room Cycle avor. | 30pFmax. : @2400+206 W.V. : 2.5Vmin. : 0.025max. : P Operating Operating I [vSv] () | temp-+o/3| TEP: |temp.+3/0| Tem? C : Nominal Capacitance (pF) WY. : 25Vmi emp. emp. Wes eoVmin. Time(min.)| _ 30+3 2to3 3043 2to3 2 0.05max. (C<1.0yF) :0.09max. (C21.0UF) | sinitial measurement for high dielectric constant type W.V. : 16V Perform a heat treatment at 150+ 7o'C for one hour and then let :0.07max. (C<1.0HF) | sit for 48:4 hours at room temperature. :0.09max. (C21.0NF) | Perform the initial measurement. W.V.: 10Vmax. : 0.125max. LR. More than 10,000MQ or 500QF (Whichever is smaller) Dielectric No fal Strength jo failure Continued on the following page.Continued from the preceding page. Specification No. Item Temperature : Test Method : High T : Compensating Type igh Dielectric Type The measured and observed characteristics shall satisfy the specifications in the following table. Appearance | No marking defects. Capacitance | Within +5% or -0.5pF X5R.X7R : Within 12.5% Change (Whichever is larger) Z5U,Y5V : Within +30% [X5R,X7R] W.V.: 25Vmin. : 0.05max. W.V. : 16/10V : 0.05max. W.V. : 6.3V 30pF and over:Q2350 0.075max. (C<3.3HF) | Sit the capacitor at 402C and 90 to 95% humiduty for 500412 Humidity 10pF and over 7u 0.125max. (C23.3yF) hours. 16 | Steady 30pF and below : [25U] ; Remove and letsit for 242 hours (temperature compensating State Q/D.F. Q227545C/2 W.V. : 25Vmin.:0.05max. type) or 48:-t4 hours (high dielectric constant type) at room tem- 10pF and below : {Y5V] perature, then measure. W.V. : 25Vmin. Q2200+10C C : Nominal Capacitance (pF) : 0.075max. (C<1.0F) P P : 0.0125max.(C21.0uF) W.V. : 16V : 0.1max. (C<1.0UF) :0.125max. (C21.0uF) W.V. : 10Vmax. : 0.15max. LR. More than 1,000MQ or 50Q*F(Whichever is smaller) Dielectric . Strength No failure The measured and observed characteristics shall satisfy the specifications in the following table. Appearance | No marking defects. X5R,X7R : Within 12.5% + ithi Ly Capacitance | Within +7.5% or +0.75pF Z5U : Within 30% Cha Which is larger) Y5V ; Within 30% mg | (Whichever is larg [W.V. : 10Vmax.] YSV : Within +30/40% Apply the rated voltage at 402C and 90 to 95% humidity for [X5R,X7R] 500+12 hours. Remove and let sit for 2442 hours (temperature W.V. : 25Vmin. ; 0.05max. compensating type) or 484 Hours (high dielectric constant W.V. = 16/10V : 0.05max. type) at room temperature, then muasure. The charge/discharge 7 Humidity W.V. : 6.3V current is less than 50mA. Load 0.075max. (C<3.3pF) 0.125max. (C23.3pF) * Initial measurement for YSV/10Vmax. 30pF and over : Q2200 [Z5U} Apply the rated DC voitage for 1 hour at 40+2C. 30pF and below : W.V. : 25Vmin. : 0.05max. Remove and let sit for 4844 hours at room temperature. Q/D.F. Q2100+10C/3 [Y5V] Perform initial measurement. C: Nominal Capacitance (pF) | W.V.: 25Vmin. : 0.075max. (C<10pF) :0.0125max. (C2 1.0uF) W.V. : 16V : 0.4max. (C<1.0uF) : 0.125max. (C21.0uF) W.V. : 10Vmax. : 0.15max. LR. More than 500MQ or 25Q*F (Whichever is smaller) Dielectric No fail Strength 0 failure Continued on the following page.Continued from the preceding page. Specification No. Item Temperature . Test Method Compensating Type High Dielectric Type The measured and observed characteristics shall satisfy the specifications in the following table. Appearance | No marking defects. X5R,X7R : Within +12.5% Z5U : Within +30% Capacitance | Within +3% or t0.3pF Y5V : Within 30% Change (Whichever is larger) (Cap<1.0yF) Y5V : Within Apply 200% of the rated voltage for 1000+12 hours at the max- +30/40%(Capz1.0uF) imun operating temperature +3'C. Let sit for 24-+2 hours (tem- perature compensating type) or 484 hours (high dielectric [X5R,X7R] , constant type) at room temperature, then measure. High W.V. : 25Vmin. : 0.05max. The charge/discharge current is less than 50mA. Temperature W.V. : 16/10V : 0.05max. {nitial measurement for high dielectric constant type. Load W.V. : 6.3V Apply 200% of the rated DC voltage for one hour at the max- 18 30pF and over : Q2350 0.075max. (C<3.3yF) imun operating temperature +3C. Remove and let sit for 4844 10pF and over wu (C23.3pF) hours at room temperature. Perform initial measurement. 30pF and below : . a O/D-F. O2275+5C/2 oN 25Vmin. : 0.05max *150% for 500V 10pF and below : . W.V. : 25Vmin. Q2200+10C C : Nominal Capacitance (pF) : 0.075max. (C<1.0F) pa p 0.0125max.(C21.0NF) W.V. : 16V :0.1max. (C<1.0uF) :0.125max. (C21.0uF) W.V. : 10Vmax. : 0.15max. LR. More than 1,000MQ or 50Q*F(Whichever is smaller) Dielectric No fail Strength jo failure 19) Notice When mounting capacitor of 500V rated voltage, perform the epoxy resin coating(min.1.0mm thickness) Table A Capacitance Change from 25C (%) Char. Nominal Values (ppm/c)* 55 30 10 Max. Min. Max. Min. Max. Min. CoG O+ 30 0.58 -0.24 0.40 0.17 0.25 0.11 COH Ot 60 0.87 0.48 0.59 0.33 0.38 0.21 P2H 150+ 60 2.33 0.72 1.61 0.50 1.02 0.32 R2H ~220+ 60 3.02 1.28 2.08 0.88 1.32 0.56 $2H 330+ 60 4.09 2.16 2.81 1.49 1.79 0.95 T2H 470+ 60 5.46 3.28 3.75 2.26 2.39 1.44 U2J 750120 8.78 .04 6.04 3.47 3.84 2.21 SL +350 to 1000 _ - - ~ - - *Nominal values denote the temperature coefficient within a range of 25C to 125C (for CoA)/85 (for other TC).