1
Motorola Small–Signal Transistors, FETs and Diodes Device Data
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NPN Silicon
MAXIMUM RATINGS
Rating Symbol MMPQ2222 MMPQ2222A Unit
CollectorEmitter Voltage VCEO 30 40 Vdc
CollectorBase Voltage VCB 60 75 Vdc
EmitterBase Voltage VEB 5.0 Vdc
Collector Current — Continuous IC500 mAdc
Each
Transistor
Four
Transistors
Equal Power
Total Power Dissipation
@ TA = 25°C
Derate above 25°C
PD0.52
4.2 1.0
8.0
Watts
mW/°C
Total Power Dissipation
@ TC = 25°C
Derate above 25°C
PD0.8
6.4 2.4
19.2
Watts
mW/°C
Operating and Storage
Junction Temperature Range TJ, Tstg –55 to +150 °C
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Characteristic Symbol Min Typ Max Unit
OFF CHARACTERISTICS
CollectorEmitter Breakdown Voltage(1) MMPQ2222
(IC = 10 mAdc, IB = 0) MMPQ2222A V(BR)CEO 30
40
Vdc
CollectorBase Breakdown Voltage MMPQ2222
(IC = 10
m
Adc, IE = 0) MMPQ2222A V(BR)CBO 60
75
Vdc
EmitterBase Breakdown Voltage
(IB = 10
m
Adc, IC = 0) V(BR)EBO 5.0
Vdc
Collector Cutoff Current
(VCB = 50 Vdc, IE = 0) MMPQ2222
(VCB = 60 Vdc, IE = 0) MMPQ2222A
ICBO
50
10
nAdc
Emitter Cutoff Current
(VEB = 3.0 Vdc, IC = 0) IEBO 100 nAdc
1. Pulse Test: Pulse Width
v
300
m
s; Duty Cycle
v
2.0%.
Thermal Clad is a trademark of the Bergquist Company
Preferred devices are Motorola recommended choices for future use and best overall value.
Order this document
by MMPQ2222/D
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SEMICONDUCTOR TECHNICAL DATA
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*Motorola Preferred Device
CASE 751B–05, STYLE 4
SO–16
1
16
Motorola, Inc. 1996
1
2
3
4
5
6
7
8
10
11
12
13
14
15
16
9
REV 1
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2 Motorola Small–Signal Transistors, FETs and Diodes Device Data
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted) (Continued)
Characteristic Symbol Min Typ Max Unit
ON CHARACTERISTICS
DC Current Gain(1)
(IC = 100
m
A, VCE = 10 V) MMPQ2222A
(IC = 1.0 mA, VCE = 10 V) MMPQ2222A
(IC = 10 mA, VCE = 10 V) MMPQ2222
MMPQ2222A
(IC = 150 mA, VCE = 10 V) MMPQ2222
MMPQ2222A
(IC = 300 mA, VCE = 10 V) MMPQ2222
(IC = 500 mA, VCE = 10 V) MMPQ2222A
(IC = 150 mA, VCE = 1.0 V) MMPQ2222A
hFE 35
50
75
75
100
100
30
40
50
300
CollectorEmitter Saturation Voltage(1)
(IC = 150 mAdc, IB = 15 mAdc) MMPQ2222
MMPQ2222A
(IC = 300 mAdc, IB = 30 mAdc) MMPQ2222
(IC = 500 mAdc, IB = 50 mAdc) MMPQ2222A
VCE(sat)
0.4
0.3
1.6
1.0
Vdc
BaseEmitter Saturation Voltage(1)
(IC = 150 mAdc, IB = 15 mAdc) MMPQ2222
MMPQ2222A
(IC = 300 mAdc, IB = 30 mAdc) MMPQ2222
(IC = 500 mAdc, IB = 50 mAdc) MMPQ2222A
VBE(sat)
1.3
1.2
2.6
2.0
Vdc
DYNAMIC CHARACTERISTICS
CurrentGain — Bandwidth Product(1)
(IC = 20 mAdc, VCE = 20 Vdc, f = 100 MHz) fT200 350 MHz
Output Capacitance
(VCB = 10 Vdc, IE = 0, f = 1.0 MHz) Cob 4.5 pF
Input Capacitance
(VEB = 0.5 Vdc, IC = 0, f = 1.0 MHz) Cib 17 pF
SWITCHING CHARACTERISTICS
Turn–On Time
(VCC = 30 Vdc, VBE(off) = –0.5 Vdc, IC = 150 mAdc,
IB1 = 15 mAdc)
ton 25 ns
Turn–Off Time
(VCC = 30 Vdc, IC = 150 mAdc, IB1 = IB2 = 15 mAdc) toff 250 ns
1. Pulse Test: Pulse Width
v
300
m
s; Duty Cycle
v
2.0%.
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3
Motorola Small–Signal Transistors, FETs and Diodes Device Data
INFORMATION FOR USING THE SO–16 SURFACE MOUNT PACKAGE
MINIMUM RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS
Surface mount board layout is a critical portion of the total
design. The footprint for the semiconductor packages must
be the correct size to insure proper solder connection
interface between the board and the package. With the
correct pad geometry, the packages will self align when
subjected to a solder reflow process.
SO–16
mm
inches
0.060
1.52
0.275
7.0
0.024
0.6 0.050
1.270
0.155
4.0
SO–16 POWER DISSIPATION
The power dissipation of the SO–16 is a function of the
pad size. This can vary from the minimum pad size for
soldering to a pad size given for maximum power dissipation.
Power dissipation for a surface mount device is determined
by TJ(max), the maximum rated junction temperature of the
die, RθJA, the thermal resistance from the device junction to
ambient, and the operating temperature, TA. Using the
values provided on the data sheet for the SO–16 package,
PD can be calculated as follows:
PD = TJ(max) – TA
RθJA
The values for the equation are found in the maximum
ratings table on the data sheet. Substituting these values into
the equation for an ambient temperature T A of 25°C, one can
calculate the power dissipation of the device which in this
case is 1.0 watts.
PD = 150°C – 25°C
125°C/W = 1.0 watts
The 125°C/W for the SO–16 package assumes the use of
the recommended footprint on a glass epoxy printed circuit
board to achieve a power dissipation of 1.0 watts. There are
other alternatives to achieving higher power dissipation from
the SO–16 package. Another alternative would be to use a
ceramic substrate or an aluminum core board such as
Thermal Clad. Using a board material such as Thermal
Clad, an aluminum core board, the power dissipation can be
doubled using the same footprint.
SOLDERING PRECAUTIONS
The melting temperature of solder is higher than the rated
temperature of the device. When the entire device is heated
to a high temperature, failure to complete soldering within a
short time could result in device failure. Therefore, the
following items should always be observed in order to
minimize the thermal stress to which the devices are
subjected.
Always preheat the device.
The delta temperature between the preheat and
soldering should be 100°C or less.*
When preheating and soldering, the temperature of the
leads and the case must not exceed the maximum
temperature ratings as shown on the data sheet. When
using infrared heating with the reflow soldering method,
the difference shall be a maximum of 10°C.
The soldering temperature and time shall not exceed
260°C for more than 10 seconds.
When shifting from preheating to soldering, the
maximum temperature gradient shall be 5°C or less.
After soldering has been completed, the device should
be allowed to cool naturally for at least three minutes.
Gradual cooling should be used as the use of forced
cooling will increase the temperature gradient and result
in latent failure due to mechanical stress.
Mechanical stress or shock should not be applied during
cooling.
* Soldering a device without preheating can cause excessive
thermal shock and stress which can result in damage to the
device.
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4 Motorola Small–Signal Transistors, FETs and Diodes Device Data
PACKAGE DIMENSIONS
CASE 751B–05
SO–16
ISSUE J
1 8
16 9
SEATING
PLANE
F
J
M
RX 45
_
G
8 PLP
–B–
–A–
M
0.25 (0.010) B S
–T–
D
K
C
16 PL
S
B
M
0.25 (0.010) A S
T
STYLE 4:
PIN 1. COLLECTOR, DYE #1
2. COLLECTOR, #1
3. COLLECTOR, #2
4. COLLECTOR, #2
5. COLLECTOR, #3
6. COLLECTOR, #3
7. COLLECTOR, #4
8. COLLECTOR, #4
9. BASE, #4
10. EMITTER, #4
11. BASE, #3
12. EMITTER, #3
13. BASE, #2
14. EMITTER, #2
15. BASE, #1
16. EMITTER, #1
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MILLIMETER.
3. DIMENSIONS A AND B DO NOT INCLUDE
MOLD PROTRUSION.
4. MAXIMUM MOLD PROTRUSION 0.15 (0.006)
PER SIDE.
5. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL BE 0.127 (0.005) TOTAL
IN EXCESS OF THE D DIMENSION AT
MAXIMUM MATERIAL CONDITION.
DIM MIN MAX MIN MAX
INCHESMILLIMETERS
A9.80 10.00 0.386 0.393
B3.80 4.00 0.150 0.157
C1.35 1.75 0.054 0.068
D0.35 0.49 0.014 0.019
F0.40 1.25 0.016 0.049
G1.27 BSC 0.050 BSC
J0.19 0.25 0.008 0.009
K0.10 0.25 0.004 0.009
M0 7 0 7
P5.80 6.20 0.229 0.244
R0.25 0.50 0.010 0.019
_ _ _ _
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MMPQ2222/D
*MMPQ2222/D*