Avalanche Rugged Technology
Rugged Gate Oxide Technology
Lower Input Capacitance
Improved Gate Charge
Extended Safe Operating Area
175 Operating Temperature
Lower Leakage Current : 10 A (Max.) @ VDS = 100V
Lower RDS(ON) : 0.041 (Typ.)
Advanced Power MOSFET
Thermal Resistance
Junction-to-Case
Case-to-Sink
Junction-to-Ambient
RJC
RCS
RJA
/W
Characteristic Max. UnitsSymbol Typ.
FEATURES
Absolute Maximum Ratings
Drain-to-Source Voltage
Continuous Drain Current (TC=25 )
Continuous Drain Current (TC=100 )
Drain Current-Pulsed
Gate-to-Source Voltage
Single Pulsed Avalanche Energy
Avalanche Current
Repetitive Avalanche Energy
Peak Diode Recovery dv/dt
Total Power Dissipation (TC=25 )
Linear Derating Factor
Operating Junction and
Storage Temperature Range
Maximum Lead Temp. for Soldering
Purposes, 1/8from case for 5-seconds
Characteristic Value UnitsSymbol
IDM
VGS
EAS
IAR
EAR
dv/dt
ID
PD
TJ , TSTG
TL
A
V
mJ
A
mJ
V/ns
W
W/
A
VDSS V
TO-220
1.Gate 2. Drain 3. Source
3
2
1
µ
O
1
O
2
O
3
ΟC
ΟC
O
1
O
1
ΟC
ΟC
ΟC
ΟC
ΟC
θ
θ
θ
IRF540A
BVDSS = 100 V
RDS(on) = 0.052
ID = 28 A
100
28
19.8
110
523
28
10.7
6.5
107
0.71
- 55 to +175
300
1.4
--
62.5
--
0.5
--
20
+
_
©1 999 Fair c hild Sem iconductor Corpora tion
Rev. B
N-CHANNEL
POWER MOSFET
Electrical Characteristics (TC=25 unless otherwise specified)
Drain-Source Breakdown Voltage
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
CharacteristicSymbol Max. UnitsTyp.Min. Test Condition
Static Drain-Source
On-State Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain(Miller) Charge
gfs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
BVDSS
BV/ TJ
VGS(th)
RDS(on)
IGSS
IDSS
V
VV
nA
A
pF
ns
nC
--
--
--
--
--
--
--
--
--
--
--
--
--
VGS=0V,ID=250 A
ID=250 A See Fig 7
VDS=5V,ID=250 A
VGS=20V
VGS=-20V
VDS=100V
VDS=80V,TC=150
VGS=10V,ID=14A
VDS=40V,ID=14A
VDD=50V,ID=28A,
RG=9.1
See Fig 13
VDS=80V,VGS=10V,
ID=28A
See Fig 6 & Fig 12
Drain-to-Source Leakage Current
VGS=0V,VDS=25V,f =1MHz
See Fig 5
Source-Drain Diode Ratings and Characteristics
Continuous Source Current
Pulsed-Source Current
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
IS
ISM
VSD
trr
Qrr
CharacteristicSymbol Max. UnitsTyp.Min. Test Condition
--
--
--
--
--
A
V
ns
C
Integral reverse pn-diode
in the MOSFET
TJ=25 ,IS=28A,VGS=0V
TJ=25 ,IF=28A
diF/dt=100A/ s
ΟC
µ
O
4
O
5
ΟCµµ
ΟC
O
4
O
4
O
4
O
4
O
1
ΟC
µ
ΟC
O
5
O
4
µ
µ
IRF540A
100
--
2.0
--
--
--
--
--
0.11
--
--
--
--
--
325
148
18
18
90
56
60
10.8
27.9
--
--
4.0
100
-100
10
100
0.052
--
1710
380
170
50
50
180
120
78
--
--
22.56
1320
--
--
--
132
0.63
28
110
1.5
--
--
Notes ;
Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
L=1mH, IAS=28A, VDD=25V, RG=27 , Starting TJ =25
ISD 28A, di/dt 400A/ s, VDD BVDSS , Starting TJ =25
Pulse Test : Pulse Width = 250 s, Duty Cycle 2%
Essentially Independent of Operating Temperature
<
_<
_
<
_<
_
O
1
O
2
O
3
O
4
O
5
oC
oC
µµ
N-CHANNEL
POWER MOSFET
Fig 1. Output Characteristics Fig 2. Transfer Characteristics
Fig 6. Gate Charge vs. Gate-Source VoltageFig 5. Capacitance vs. Drain-Source Voltage
Fig 4. Source-Drain Diode Forward VoltageFig 3. On-Resistance vs. Drain Current
IRF540A
10-1 100101
100
101
102
@ Notes :
1. 250 µs Pulse Test
2. TC = 25 oC
VGS
Top : 1 5 V
1 0 V
8.0 V
7.0 V
6.0 V
5.5 V
5.0 V
Bottom : 4.5 V
ID , Drain Current [A]
VDS , Drain-Source Voltage [V]
2 4 6 8 10
100
101
102
25 oC
175 oC
- 55 oC
@ Notes :
1. VGS = 0 V
2. VDS = 40 V
3. 250 µs Pulse Test
ID , Drain Current [A]
VGS , Gate-Source Voltage [V]
030 60 90 120
0.00
0.02
0.04
0.06
0.08
@ Note : TJ = 25 oC
V
GS = 20 V
V
GS = 10 V
RDS(on)
, [
]
Drain-Source On-Resistance
ID
, Drain Current [A] 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 2.4
100
101
102
175 oC
25 oC
@ Notes :
1. VGS = 0 V
2. 250 µs Pulse Test
IDR
, Reverse Drain Current [A]
V
SD , Source-Drain Voltage [V]
100101
0
500
1000
1500
2000
2500 C
iss= Cgs+ Cgd ( C
ds= shorted )
C
oss= Cds+ Cgd
C
rss= Cgd
@ Notes :
1. VGS = 0 V
2. f = 1 MHz
C rss
C oss
C iss
Capacitance [pF]
V
DS , Drain-Source Voltage [V] 010 20 30 40 50 60 70
0
5
10
V
DS = 80 V
V
DS = 50 V
V
DS = 20 V
@ Notes : ID =28.0 A
VGS
, Gate-Source Voltage [V]
QG
, Total Gate Charge [nC]
N-CHANNEL
POWER MOSFET
Fig 7. Breakdown Voltage vs. Temperature Fig 8. On-Resistance vs. Temperature
Fig 11. Thermal Response
Fig 10. Max. Drain Current vs. Case TemperatureFig 9. Max. Safe Operating Area
PDM
t1t2
IRF540A
-75 -50 -25 025 50 75 100 125 150 175 200
0.8
0.9
1.0
1.1
1.2
@ Notes :
1. VGS = 0 V
2. ID = 250 µA
BVDSS
, (Normalized)
Drain-Source Breakdown Voltage
T
J , Junction Temperature [ oC]
-75 -50 -25 025 50 75 100 125 150 175 200
0.0
0.5
1.0
1.5
2.0
2.5
3.0
@ Notes :
1. VGS = 10 V
2. ID = 14.0 A
RDS(on)
, (Normalized)
Drain-Source On-Resistance
T
J , Junction Temperature [ oC]
100101102
10-1
100
101
102
103
10 µs
DC
100 µs
1 ms
10 ms
@ Notes :
1. TC = 25 oC
2. TJ = 175 oC
3. Single Pulse
Operation in This Area
is Limited by R DS(on)
ID , Drain Current [A]
V
DS , Drain-Source Voltage [V]
10-5 10-4 10-3 10-2 10-1 100101
10-2
10-1
100
single pulse
0.2
0.1
0.01
0.02
0.05
D=0.5
@ Notes :
1. ZθJC(t)=1.4 oC/W Max.
2. Duty Factor, D=t
1/t2
3. TJM-TC=PDM*ZθJC(t)
ZθJC
(t) , Thermal Response
t1 , Square Wave Pulse Duration [sec]
25 50 75 100 125 150 175
0
5
10
15
20
25
30
ID , Drain Current [A]
T
c , Case Temperature [ oC]
N-CHANNEL
POWER MOSFET
Fig 12. Gate Charge Test Circuit & Waveform
Fig 13. Resistive Switching Test Circuit & Waveforms
Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms
EAS = LL IAS2
----
2
1--------------------
BVDSS -- VDD
BVDSS
Vin
Vout
10%
90%
td(on) tr
t on t off
td(off) tf
Charge
VGS
10V
Qg
Qgs Qgd
Vary tp to obtain
required peak ID
10V
VDD
C
LL
VDS
ID
RG
t p
DUT
BVDSS
t p
VDD
IAS
VDS (t)
ID (t)
Time
VDD
( 0.5 rated VDS )
10V
Vout
Vin
RL
DUT
RG
3mA
VGS
Current Sampling (IG)
Resistor Current Sampling (ID)
Resistor
DUT
VDS
300nF
50K
200nF12V
Same Type
as DUT
Current Regulator
R1R2
IRF540A
N-CHANNEL
POWER MOSFET
Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
VDS
+
--
L
I S
Driver
VGS
RGSame Type
as DUT
VGS dv/dt controlled by “RG
IS controlled by Duty Factor “D”
VDD
10V
VGS
( Driver )
I S
( DUT )
VDS
( DUT )
VDD
Body Diode
Forward Voltage Drop
Vf
IFM , Body Diode Forward Current
Body Diode Reverse Current
IRM
Body Diode Recovery dv/dt
di/dt
D = Gate Pulse Width
Gate Pulse Period
--------------------------
IRF540A
TRADEMARKS
ACEx™
CoolFET™
CROSSVOLT™
E2CMOSTM
FACT™
FACT Quiet Series™
FAST®
FASTr™
GTO™
HiSeC™
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with instructions for use provided in the labeling, can be
reasonably expected to result in significant injury to the
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be reasonably expected to cause the failure of the life
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Definition of Terms
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This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
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changes at any time without notice in order to improve
design.
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In Design
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