- RF Transistors 2N918, JAN 2N918 (continued) TABLE |: GROUP A INSPECTION (7, = 25C = 3C unless otherwise noted) (continued) Mil-Std-750 Limits . * inati Symbol = Unit {TPD Examination or Test Method y Min | Max SUBGROUP 3 Output Capacitance 3236 Con pF ) Vog = 10 Vde, 1, =0, f 20.1 MHz & 1.0 MHz) All Types - 1.7 Wop =% Ty =o, f 20.1 MHz & 1.0 MHz) All Types - 3.0 Input Capacitance 3240 Cw pF Vap = 0.5 Vde, I, =0, f 20.1 MHz & = 1.0 MHz) All Types ( Note 1) - 2.0 SUBGROUP 4 Small-Signal Current Gain 3306 [Pref - Vor = 10 Vdc, I, = 4.0 mAdc, f = 100 MHz) All Types 6.0 - Small-Signal Amplifier Gain (Figure 2) Soe aB Voc = 12 Vde, I, = 6.0 mAdc, f = 200 MHz) All Types 15 - 10 Collector-Base Time Constant Ho, ps Vog = 10 Vde, I, = -4.0 mAdc, f = 79.8 MHz) JAN2N918 - 25 Noise Figure { Note 2) NF aB Vor = 6.0 Vde, Io 21,0 mAdc, Ro = 400 ohms, f = 60 MHz) All Types - 6.0 Oscillator Power Output ( Note 3} Pout mw Vop = 15 Vde, I, = 8.0 mAdc, f = 500 MHz) All Types 30 - Collector -Efficiency Test (Note 3) n % Vog =15 Vde, To = 8,0 mAdc, f = 500 MHz) All Types 25 - SUBGROUP 5 (Note 4) ( Note 4) High Temperature Operation Collector-Base Cutoff Current 3036 Topo Adc (V_., = 15 Vde, I, =0, CB E Ta 150C) All Types Condition D - 1.0 Low Temperature Operation DC Current Gain 3076 hyp - Vor = 1.0 Vde, I, = 3.0 mAde, Ty = -55C) JAN2N918 (Note 4) 10 - 4 Applies to Meg-A-Life Il and Mil Units Only +Minimum value only applies to Standard Unit NOTES: 1. This test shall be in accordance with Method 3240 of MIL-STD-750 5. All applicable end-point test measurements shall be made within except that the output capacitor is omitted. Noise Figure shall be measured using a HP 342A NF Meter in ac- cordance with HP 342A pertinent test procedure or by use of a suitable equivalent test-equipment circuit and procedure. . Sample units shall be allowed to return to and be stabilized at room ambient temperature prior to being subjected to the Low- Temperature Operation test. . Test Measurement shall be made after thermal equilibrium has been reached at the temperature specified. s 9-16 four hours after the particular sample units have been subjected to the required physical-mechanical or environmental test(s). This re- quirement is not applicable to measurements specified to be made during (subjection of sample units) a physical-mechanical or envi- ronmental test, and shall not be applicable where otherwise speci- fied for life test(s). There shall be no evidence of flaking, pitting, or other visible signs of corrosion on sample units, upon examination without magnifica- tions, after subjection to test. Per MIL-STD-202, Method 112, Test Condition C, Procedure llla and Test Condition A for Gross Leaks.- RF Transistors 2N918, JAN 2N918 (continued) TABLE I!: GROUP B INSPECTION (Fourth lead is floating unless otherwise specified.) +o il-Std- Limits Examination or Test MilStd-750 | symbol Unit LTPD Method | ~ Min | Max SUBGROUP 1 Physical Dimensions 2066 - - - - 20 SUBGROUP 2 Solderability 2026 . . . . 1 Temperature Cycling 1051 Condition C - - - - Thermal Shock (Glass Strain) 1056 Condition A - - - - Seal (Leak Rate) ( Note 7 ) Moisture Resistance (No Initial Conditioning) 1021 . - ~ ~ > 10 End-Point Tests: (Note 5) Collector-Base Cutoff Current 3036 opo 10 nAdc (Yop = 15 Vde, I, = 0) Condition D DC Current Gain 3076 hop - J (I = 3.0 mAdc, Yor = 1.0 Vde) 20 200 rT SUBGROUP 3 Shock 2016 - - - - 7 {1500 G, 0.5 ms, 5 blows each, Non-operating Orientations xX, Ys Yy zy Total = 20 blows) Vibration, Variable Frequency 2056 - - - - Vibration Fatigue (20 G) 2046 - - - - ry Non-operating Constant Acceleration (Centrifuge) 2006 - - - - (20,000 G, Orientations X,, Y,, Y,, Z,) 1 v2 L End-Point Tests: Same as Subgroup 2 (Note 5) / SUBGROUP & Lead Fatigue 2036 - - - - 7 Condition E End-Point Tests: 5 hee -7 atm Seal (Notes 5 and 7) - | 5x10 em?/s ] SUBGROUP 5 Salt Atmosphere (Corrosion) (Note 6) 1041 - - - - End-Point Tests: 20 Same as Subgroup 2 SUBGROUP 6 High Temperature Life (Non-Operating) 1031 - - - - A215 Tate = +200C, min) Non-operating! End-Point Tests: (Note 5) Collector-Base Cutoff Current 3036 leno nAde Vox = 15 Vde, I = 0) Condition D - 20 DC Current Gain 3076 hep - (Ig = 3.0 made, Veg, = 1.0 Vde) + 2% of Group A Limits suaGRoup 7 Steady State Operation Life 1026 - - - - A=15 (Py = 200 mw, I, = 20 mAdc, Ty, = 25C + 3C) End-Point Tests: (Note ) Same as Subgroup 6 9-17 RF Transistors 2N918, JAN 2N918 (continued) TABLE tll: CONDITIONING and SCREENING Mil-Std-750 gs a S Conditions Limits Procedure Symbol Method BURN-IN at rated Power for 96 hours - ~ Vor = 10 Vade, Ty = 26C - ELECTRICAL SCREENS After Burn-In i 3076 1, = 3.0 mAde, Vou = 1.0 Vde, Pulsed* | _ 720% Within DC Current Gain Shee cu? Co Vor 74: c, Puls Group A Limits Changes in hoe before and after Burn-In, measured at stated conditions. Collector -Base Cutoff Current qT 3036 v = 15 Vie cBo Condition D cB Collector-Emitter Saturation Voltage VoK(sat) 3071 I, =10 mA, I, = 1.0 mA, Pulsed* Group A Limits Base-Emitter Saturation Voltage VpE(sat) 3066 I, =10 mA, Ip = 1.0 mA; Pulsed* Condition A * Pulse Width < 300 us, Duty Cycle < 2.0% FIGURE 1 NOISE FIGURE TEST BLOCK DIAGRAM The test fixture shall consist of a 60 MHz tuned amplifier and suitable NOISE FIGURE METER VHF NOISE SOURCE biasing circuits. It should be constructed utilizing good very-high-frequency HEWLETT-PACKARD 342A HIEWLETT-PACKARD 343A | design techniques. (OR EQUIVALENT). (OR EQUIVALENT). The effective source susceptance should be tuned for each device being tested to obtain minimum noise figure. Note that because the HP 343A has a50-ohm output resistance, a suitable impedance transformer must be used to obtain an effective source conductance of 2.5 mmho at the transistor (INPUT (60 MHz) POWER SUPPLY with minimum losses. (60 MHz) TEST FIXTURE CONSTANT Ic AND Vee FIGURE 2 NEUTRALIZED 200 MHz POWER AMPLIFIER GAIN TEST CIRCUIT 1000 pF FROM 50 Q2 SOURCE Ver +ec NEUTRALIZATION PROCEDURE: A - Connect 200 MHz signal generator (with 50 ohm output impedance) to 1000 pF FIGURE 3~-500 MHz OSCILLATOR TEST CIRCUIT L2 LEAD 4 (CASE) OUTPUT FLOATING 500 MHz OSCILLATOR ADJUSTMENT PROCEDURE: Measurements of P..4 Shall be made in this circuit or a suitable equivalent. The circuit adjustment procedure is as follows: A Set Vcc and Veg to obtain specified test conditions. input terminals of amplifier, and connect 50 ohm RF voltmeter to out- B Adjust stub tuner to obtain maximum output at specified frequency put terminals of amplifier. B Apply Vee and Vcc to obtain specified test conditions. of oscillation. C Check I and reset if necessary. C Adjust output of signal generator to approximately 10 millivolts and D Read Pou. tune C1 and C2 for maximum output. Note: Collector efficiency (7), may be determined as follows: D Interchange connections to signa! generator and RF voltmeter and with 7in % = Pas x 100 sufficient signat applied at output terminals, tune L2 for minimum indi- 120 cation on RF-voltmeter. E Repeat this sequence until optimum settings are obtained for all variables. CIRCUIT COMPONENT INFORMATION: Where Pay is in milliwatts. CIRCUIT COMPONENT INFORMATION: L1: 2 turns #16 AWG, 3/8 OD, 2 GR Type 874 TEE 11/4" length 1 GR Type 874-D20 Adjustable Cl: 3-12 pF L2: 0.4-0.65 pH Miller #4303 (or L2: 9 turns #22 AWG, 3/16 OD, Stub C2: 1.5-7.5 pF equal) 1/2" length 1 GR Type 874-LA Adjustable Ll: 3.1/2 turns #16 AWG 5/16 U3: Se sete AWG lie" (0. Capacitance values are in pF. 1 GR Type 874-WN3B Short- Do 16 length, turns ratio tol Btn. tu ~ Double Stub Tuner consists of the Circuit Termination <to following commercially available . *External interlead shield to isolate collector lead from emitter and base leads. components. (or equivalents) 9-18